Interpretation of holographic contour maps of reverse biased p-n junctions

被引：14

作者：

Capiluppi, C

Migliori, A

Pozzi, G

机构：

[1] UNIV BOLOGNA,IST NAZL FIS MAT,I-40127 BOLOGNA,ITALY

[2] CNR,LAMEL,I-40129 BOLOGNA,ITALY

来源：

MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1995年 / 6卷 / 5-6期

关键词：

D O I：

10.1051/mmm:1995154

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Reverse-biased p-n junctions have been observed by means of electron holography using a transmission electron microscope equipped with an electron biprism and a field emission gun. Aim of this work is to present and discuss an analytical model for the electric field associated to a periodic array of alternating p and n stripes lying in a half-plane which simulates the experimental setup and allows the interpretation of the main features of the observed holograms and the quantitative evaluation of the effect of the fringing field on the holograms and on the reconstructed images.

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页码：647 / 657

页数：11

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