DEEP LEVEL TRANSIENT FOURIER SPECTROSCOPY (DLTFS) - A TECHNIQUE FOR THE ANALYSIS OF DEEP LEVEL PROPERTIES

被引：328

作者：

WEISS, S

KASSING, R

机构：

来源：

SOLID-STATE ELECTRONICS | 1988年 / 31卷 / 12期

关键词：

D O I：

10.1016/0038-1101(88)90071-8

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1733 / 1742

页数：10

共 9 条

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