THE VACUUM-ULTRAVIOLET SCANNING PHOTOELECTRON MICROSCOPE AT MAX-LAB

被引:26
作者
JOHANSSON, U [1 ]
NYHOLM, R [1 ]
TORNEVIK, C [1 ]
FLODSTROM, A [1 ]
机构
[1] ROYAL INST TECHNOL,S-10044 STOCKHOLM,SWEDEN
关键词
D O I
10.1063/1.1145986
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The performance of a scanning photoelectron microscope at the MAX I storage ring in Lund is presented. The microscope utilizes undulator radiation in the energy range 15-150 eV and is comprised of a plane-grating monochromator with a Kirkpatrick-Baez objective and a gracing incidence ellipsoidal focusing mirror. The instrument with its high photon flux, 109-1010 photons/s, and narrow bandwidth, better than 0.2 eV, is excellently suited for high-resolution core-level spectroscopy and imaging of samples with lateral inhomogeneties in the micrometer range. © 1995 American Institute of Physics.
引用
收藏
页码:1398 / 1400
页数:3
相关论文
共 14 条
[1]   X-RAY SPECTROMICROSCOPY WITH A ZONE PLATE GENERATED MICROPROBE [J].
ADE, H ;
KIRZ, J ;
HULBERT, SL ;
JOHNSON, ED ;
ANDERSON, E ;
KERN, D .
APPLIED PHYSICS LETTERS, 1990, 56 (19) :1841-1844
[2]  
ADE H, 1992, XRAY MICROSCOPY, V3, P226
[3]   A VUV UNDULATOR FOR MAX [J].
ERIKSSON, M ;
MEINANDER, T ;
WERIN, S .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1988, 265 (03) :587-595
[4]   FROM SMALL-AREA TO IMAGING PHOTOABSORPTION SPECTROSCOPY [J].
KING, PL ;
BORG, A ;
KIM, C ;
PIANETTA, P ;
LINDAU, I ;
KNAPP, GS ;
KEENLYSIDE, M ;
BROWNING, R .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1990, 291 (1-2) :19-25
[5]   SCHOTTKY TYPE PHOTODIODES AS DETECTORS IN THE VUV AND SOFT-X-RAY RANGE [J].
KRUMREY, M ;
TEGELER, E ;
BARTH, J ;
KRISCH, M ;
SCHAFERS, F ;
WOLF, R .
APPLIED OPTICS, 1988, 27 (20) :4336-4341
[6]  
MOEWES A, 1992, XRAY MICROSCOPY, V3, P231
[7]   SUBMICROMETER-RESOLUTION PHOTOELECTRON-SPECTROSCOPY AT MAX LAB [J].
NYHOLM, R ;
ERIKSSON, M ;
HANSEN, K ;
SAIRANEN, OP ;
WERIN, S ;
FLODSTROM, A ;
TORNEVIK, C ;
MEINANDER, T ;
SARAKONTU, M .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (07) :2168-2171
[8]   CORE LEVEL PHOTOELECTRON MICROSCOPY [J].
PIANETTA, P ;
KING, PL ;
BORG, A ;
KIM, C ;
LINDAU, I ;
KNAPP, G ;
KEENLYSIDE, M ;
BROWNING, R .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1990, 52 :797-810
[9]   1ST RESULTS OF MICROSPECTROSCOPY FROM A SCANNING PHOTOEMISSION MICROSCOPE WITH A SUBMICRON PROBE SIZE [J].
RAYCHAUDHURI, AK ;
NG, W ;
LIANG, S ;
SINGH, S ;
WELNAK, JT ;
WALLACE, JP ;
CAPASSO, C ;
CERRINA, F ;
MARGARITONDO, G ;
UNDERWOOD, JH ;
KORTRIGHT, JB ;
PERERA, RCC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1993, 11 (04) :2324-2329
[10]  
STORJOHAN I, 1992, XRAY MICROSCOPY, V3, P238