ION-IMPLANTATION INTO GALLIUM-ARSENIDE

被引:46
作者
ANHOLT, R
BALASINGAM, P
CHOU, SY
SIGMON, TW
DEAL, M
机构
[1] STANFORD UNIV,SOLID STATE ELECTR LAB,STANFORD,CA 94305
[2] STANFORD UNIV,CTR INTEGRATED SYST,STANFORD,CA 94305
关键词
D O I
10.1063/1.341475
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:3429 / 3438
页数:10
相关论文
共 33 条
[1]   DAMAGE RELATED DEEP ELECTRON LEVELS IN ION-IMPLANTED GAAS [J].
ALLSOPP, DWE ;
PEAKER, AR .
SOLID-STATE ELECTRONICS, 1986, 29 (04) :467-470
[2]   MECHANISM OF EL2 EFFECTS ON GAAS FIELD-EFFECT TRANSISTOR THRESHOLD VOLTAGES [J].
ANHOLT, R ;
SIGMON, TW .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (09) :3995-3997
[3]  
ANHOLT R, 1987, 1987 GAA IEEE IC S, P51
[4]  
Biersack J. P., 1982, ION IMPLANTATION TEC, P122, DOI DOI 10.1007/978-3-642-68779-2_5
[5]   PLANAR AND RESIDUAL CHANNELING OF SI+ IMPLANTS IN GAAS [J].
BLUNT, RT ;
DAVIES, P .
JOURNAL OF APPLIED PHYSICS, 1986, 60 (03) :1015-1018
[6]   CHANNELING EFFECT FOR LOW-ENERGY ION-IMPLANTATION IN SI [J].
CHO, K ;
ALLEN, WR ;
FINSTAD, TG ;
CHU, WK ;
LIU, J ;
WORTMAN, JJ .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 7-8 (MAR) :265-272
[7]   EFFECT OF MICROSTRUCTURE ON THE ARSENIC PROFILE IN IMPLANTED SILICON [J].
COGHLAN, WA ;
RHEE, MH ;
WILLIAMS, JM ;
STREIT, LA ;
WILLIAMS, P .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 16 (2-3) :171-176
[8]  
CRISTEL LA, 1980, J APPL PHYS, V51, P6176
[9]   PLANAR CHANNELING EFFECTS IN SI(100) [J].
CURRENT, MI ;
TURNER, NL ;
SMITH, TC ;
CRANE, D .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 6 (1-2) :336-348
[10]  
DEAL MD, 1987, 1987 P IEEE IEDM C, P245