PREPARATION OF CUBIC BORON-NITRIDE FILMS BY RF-SPUTTERING

被引:142
作者
MIENO, M
YOSHIDA, T
机构
[1] Department of Metallurgy and Materials Science, University of Tokyo, Bunkyo-ku, Tokyo, 113
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1990年 / 29卷 / 07期
关键词
Bias sputtering; Compressive stress; Cubic boron nitride; Infrared spectroscopy; Optical emission spectroscopy;
D O I
10.1143/JJAP.29.L1175
中图分类号
O59 [应用物理学];
学科分类号
摘要
Cubic boron nitride (c-BN) films have been prepared by sputtering of a hexagonal BN sintered target under a negative self-bias voltage applied to Si substrates and a sputtering gas composition of Ar/N2. A c-BN phase was found to be contained only in the films prepared in pure Ar discharge with a negative self-bias above a threshold value. Moreover, the ratio of c-BN to hexagonal boron nitride increased with increasing negative self-bias voltage. The films consisting mainly of the c-BN phase were easily peeled from Si substrates on exposure to air because of their strong compressive stress. © 1990 The Japan Society of Applied Physics.
引用
收藏
页码:L1175 / L1177
页数:3
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