X-RAY CHARACTERIZATION OF GAPLAS-GAAS SUPERLATTICES IMPORTANCE OF THE TECHNIQUES AND PROCESS USED

被引：7

作者：

AUVRAY, P

BAUDET, M

CAULET, J

REGRENY, A

机构：

来源：

REVUE DE PHYSIQUE APPLIQUEE | 1989年 / 24卷 / 07期

关键词：

D O I：

10.1051/rphysap:01989002407071100

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：711 / 720

页数：10

共 10 条

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