IMPERFECTIONS IN (GA1-XALXAS)N1-(GAAS)N2 GAAS SUPERLATTICES AS OBSERVED BY X-RAY-DIFFRACTION TECHNIQUES

被引:4
作者
PETROFF, JF
SAUVAGESIMKIN, M
BENSOUSSAN, S
CAPELLE, B
AUVRAY, P
BAUDET, M
机构
[1] UNIV PIERRE & MARIE CURIE,MINERAL CRISTALLOG LAB,CNRS,4 PL JUSSIEU,F-75252 PARIS 05,FRANCE
[2] UNIV PARIS 07,MINERAL CRISTALOG LAB,CNRS,F-75252 PARIS 05,FRANCE
[3] CTR NATL ETUD TELECOMMUN,DEPT MAT PHYS ANALYSE,F-22301 LANNION,FRANCE
关键词
The authors wish to thank Dr A. Regreny (CNET-Lannion) for providing the MBE samples. Thanks are also due to A. Jeanne Michaud for his skillful assistance in designing the illustrations. Financial support from the Centre National d'Etudes des T~lr-communications (contract 84 1B 200 LAB) is gratefully acknowledged;
D O I
10.1107/S0021889887087041
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:111 / 116
页数:6
相关论文
共 18 条
[1]   X-RAY DOUBLE-CRYSTAL DIFFRACTOMETRY OF GA1-XALXAS EPITAXIAL LAYERS [J].
BARTELS, WJ ;
NIJMAN, W .
JOURNAL OF CRYSTAL GROWTH, 1978, 44 (05) :518-525
[2]  
DELAMARRE C, 1985, SEMICONDUCTOR QUANTU, P105
[3]  
DINGLE R, 1975, ADV SOLID STATE PHYS, P21
[4]   X-RAY-DIFFRACTION STUDY OF INTER-DIFFUSION AND GROWTH IN (GAAS)N(AIAS)M MULTILAYERS [J].
FLEMING, RM ;
MCWHAN, DB ;
GOSSARD, AC ;
WIEGMANN, W ;
LOGAN, RA .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (01) :357-363
[5]  
Hetherington C. J. D., 1985, Layered Structures, Epitaxy, and Interfaces Symposium, P41
[6]  
Hill M. J., 1985, Layered Structures, Epitaxy, and Interfaces Symposium, P53
[7]   INTERFACE CHARACTERISTICS OF GAAS/ALXGA1-XAS SUPERLATTICES GROWN BY MOCVD [J].
JENG, SJ ;
WAYMAN, CM ;
COLEMAN, JJ ;
COSTRINI, G .
MATERIALS LETTERS, 1985, 3 (03) :89-92
[8]   SOME ASPECTS OF THE X-RAY STRUCTURAL CHARACTERIZATION OF (GA1-XALXAS)N1(GAAS)N2 GAAS(001) SUPERLATTICES [J].
KERVAREC, J ;
BAUDET, M ;
CAULET, J ;
AUVRAY, P ;
EMERY, JY ;
REGRENY, A .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1984, 17 (JUN) :196-205
[9]   MISMATCH AND ELECTRON-MOBILITY IN MBE GAXIN1-XAS EPITAXIAL LAYERS ON INP SUBSTRATES [J].
MASSIES, J ;
SAUVAGESIMKIN, M .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1983, 32 (01) :27-30
[10]   SYNCHROTRON-RADIATION PLANE-WAVE TOPOGRAPHY .1. APPLICATION TO MISFIT DISLOCATION IMAGING IN III-V HETEROJUNCTIONS [J].
PETROFF, JF ;
SAUVAGE, M ;
RIGLET, P ;
HASHIZUME, H .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1980, 42 (03) :319-338