ISOLATED NANOMETER-SIZE SI DOT ARRAYS FABRICATED USING ELECTRON-BEAM LITHOGRAPHY, REACTIVE ION ETCHING, AND WET ETCHING IN NH4OH/H2O2/H2O

被引:27
作者
NAKAJIMA, A
AOYAMA, H
KAWAMURA, K
机构
[1] Fujitsu Laboratories Ltd, Atsugi, 243-01
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1994年 / 33卷 / 12B期
关键词
SILICON; DOT; ARRAY; NANOFABRICATION; WET ETCHING;
D O I
10.1143/JJAP.33.L1796
中图分类号
O59 [应用物理学];
学科分类号
摘要
A simple technique for fabricating an array of isolated nanometer-size Si dots is reported. The processing procedures consist of electron beam lithography and reactive ion etching followed by wet etching in NH4OH/H2O2/H2O. The resulting array has isolated crystalline Si dots, each 10 nm in diameter and 10 nm high. To our knowledge, these are the smallest isolated crystalline Si dots reported to date.
引用
收藏
页码:L1796 / L1798
页数:3
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