STRATEGIES FOR LOT ACCEPTANCE TESTING USING CMOS TRANSISTORS AND ICS

被引：28

作者：

SCHWANK, JR

SEXTON, FW

FLEETWOOD, DM

SHANEYFELT, MR

HUGHES, KL

RODGERS, MS

机构：

[1] ALLIED SIGNAL MICROELECTR OPERAT,ALBUQUERQUE,NM

[2] L&M TECHNOL,ALBUQUERQUE,NM

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1989年 / 36卷 / 06期

关键词：

D O I：

10.1109/23.45394

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1971 / 1980

页数：10

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