TESTING CONSIDERATIONS FOR RADIATION-INDUCED LATCHUP

被引：7

作者：

BAZE, MP

JOHNSTON, AH

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1987年 / 34卷 / 06期

关键词：

D O I：

10.1109/TNS.1987.4337545

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1730 / 1735

页数：6

共 14 条

[1]

[Anonymous], COMMUNICATION

[2]

AZAREWICZ JL, 1982, IEEE T NUCL SCI, V29, P1804

[3] LATCHUP PATHS IN BIPOLAR INTEGRATED-CIRCUITS [J].

BAZE, MP ;

JOHNSTON, AH .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) :1499-1504

[4] HIGH-TEMPERATURE SCHOTTKY TTL LATCHUP [J].

COOPER, MS ;

RETZLER, JP ;

MESSENGER, GC .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1978, 25 (06) :1538-1544

[5] USE OF A PULSED LASER AS AN AID TO TRANSIENT UPSET TESTING OF I2L LSI MICROCIRCUITS [J].

ELLIS, TD ;

KIM, YD .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1978, 25 (06) :1489-1493

[6]

HABING DH, 1965, IEEE T NUCL SCI, V12

[7]

HARRITY JW, 1980, 1980 NSREC ITH

[8] A BETTER UNDERSTANDING OF CMOS LATCH-UP [J].

HU, GJ .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (01) :62-67

[9]

JOHNSTON AH, 1985, IEEE T NUCL SCI, V32, P4018

[10] EXPERIMENTAL METHODS FOR DETERMINING LATCHUP PATHS IN INTEGRATED-CIRCUITS [J].

JOHNSTON, AH ;

BAZE, MP .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) :4260-4265

← 1 2 →