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IMPEDANCE CHARACTERISTICS OF DOUBLE-HETERO STRUCTURE LASER-DIODES
被引:34
作者
:
MORISHITA, M
论文数:
0
引用数:
0
h-index:
0
机构:
Research Institute of Electrical Communication, Tohoku University, Sendai
MORISHITA, M
OHMI, T
论文数:
0
引用数:
0
h-index:
0
机构:
Research Institute of Electrical Communication, Tohoku University, Sendai
OHMI, T
NISHIZAWA, J
论文数:
0
引用数:
0
h-index:
0
机构:
Research Institute of Electrical Communication, Tohoku University, Sendai
NISHIZAWA, J
机构
:
[1]
Research Institute of Electrical Communication, Tohoku University, Sendai
来源
:
SOLID-STATE ELECTRONICS
|
1979年
/ 22卷
/ 11期
关键词
:
D O I
:
10.1016/0038-1101(79)90068-6
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
The effects of the onset of lasing on the I-V characteristics, the impedance characteristics and the light modulation characteristics of laser diodes have been discussed by introducing the rate equations which involve carrier diffusion process in the active layer interacting with the radiation field intensity. The static I-V characteristics exhibit a kink at lasing threshold current, reflecting the decrease of effective lifetime of carriers. Effective carrier lifetimes decrease with increasing light intensity, which results in a steep attenuation of injected carrier density in the active region. The impedance and light modulation characteristics are obtained in the small signal approximation. The small signal light modulation characteristics depend strongly on whether the laser diode is excited by the constant current modulation or the constant voltage modulation. The impedance is changed drastically by the onset of lasing and exhibits a resonance which coincides exactly with the optical modulation resonance frequency. © 1979.
引用
收藏
页码:951 / 962
页数:12
相关论文
共 37 条
[31]
SEMICONDUCTOR MASER OF GAAS
QUIST, TM
论文数:
0
引用数:
0
h-index:
0
QUIST, TM
REDIKER, RH
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0
引用数:
0
h-index:
0
REDIKER, RH
KEYES, RJ
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0
引用数:
0
h-index:
0
KEYES, RJ
KRAG, WE
论文数:
0
引用数:
0
h-index:
0
KRAG, WE
LAX, B
论文数:
0
引用数:
0
h-index:
0
LAX, B
MCWHORTER, AL
论文数:
0
引用数:
0
h-index:
0
MCWHORTER, AL
ZEIGLER, HJ
论文数:
0
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0
h-index:
0
ZEIGLER, HJ
[J].
APPLIED PHYSICS LETTERS,
1962,
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[32]
MEASUREMENT OF SPONTANEOUS-EMISSION FACTOR OF ALGAAS DOUBLE-HETEROSTRUCTURE SEMICONDUCTOR-LASERS
SUEMATSU, Y
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL,DEPT PHYS ELECTR,MEGURO KU,TOKYO 152,JAPAN
TOKYO INST TECHNOL,DEPT PHYS ELECTR,MEGURO KU,TOKYO 152,JAPAN
SUEMATSU, Y
AKIBA, S
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL,DEPT PHYS ELECTR,MEGURO KU,TOKYO 152,JAPAN
TOKYO INST TECHNOL,DEPT PHYS ELECTR,MEGURO KU,TOKYO 152,JAPAN
AKIBA, S
HONG, T
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL,DEPT PHYS ELECTR,MEGURO KU,TOKYO 152,JAPAN
TOKYO INST TECHNOL,DEPT PHYS ELECTR,MEGURO KU,TOKYO 152,JAPAN
HONG, T
[J].
IEEE JOURNAL OF QUANTUM ELECTRONICS,
1977,
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600
[33]
SUPPRESSION OF RELAXATION OSCILLATION IN LIGHT OUTPUT OF INJECTION-LASERS BY ELECTRICAL RESONANCE CIRCUIT
SUEMATSU, Y
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL, DEPT PHYS ELECTR, TOKYO 152, JAPAN
SUEMATSU, Y
HONG, TH
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL, DEPT PHYS ELECTR, TOKYO 152, JAPAN
HONG, TH
[J].
IEEE JOURNAL OF QUANTUM ELECTRONICS,
1977,
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SUSAKI W, 1976, OQE7630 SPEC GROUP I
[35]
RESISTIVITY MOBILITY AND IMPURITY LEVELS IN GAAS GE AND SI AT 300 DEGREES K
SZE, SM
论文数:
0
引用数:
0
h-index:
0
SZE, SM
IRVIN, JC
论文数:
0
引用数:
0
h-index:
0
IRVIN, JC
[J].
SOLID-STATE ELECTRONICS,
1968,
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MEASUREMENTS OF LIFETIME IN GAAS DIODES
TAKUSAGAWA, M
论文数:
0
引用数:
0
h-index:
0
TAKUSAGAWA, M
FUNAYAMA, T
论文数:
0
引用数:
0
h-index:
0
FUNAYAMA, T
NISHIZAWA, J
论文数:
0
引用数:
0
h-index:
0
NISHIZAWA, J
DEMIZU, K
论文数:
0
引用数:
0
h-index:
0
DEMIZU, K
NAKANO, T
论文数:
0
引用数:
0
h-index:
0
NAKANO, T
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
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+
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WATANABE Y, 1957, Patent No. 273217
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1
2
3
4
→
共 37 条
[31]
SEMICONDUCTOR MASER OF GAAS
QUIST, TM
论文数:
0
引用数:
0
h-index:
0
QUIST, TM
REDIKER, RH
论文数:
0
引用数:
0
h-index:
0
REDIKER, RH
KEYES, RJ
论文数:
0
引用数:
0
h-index:
0
KEYES, RJ
KRAG, WE
论文数:
0
引用数:
0
h-index:
0
KRAG, WE
LAX, B
论文数:
0
引用数:
0
h-index:
0
LAX, B
MCWHORTER, AL
论文数:
0
引用数:
0
h-index:
0
MCWHORTER, AL
ZEIGLER, HJ
论文数:
0
引用数:
0
h-index:
0
ZEIGLER, HJ
[J].
APPLIED PHYSICS LETTERS,
1962,
1
(04)
: 91
-
92
[32]
MEASUREMENT OF SPONTANEOUS-EMISSION FACTOR OF ALGAAS DOUBLE-HETEROSTRUCTURE SEMICONDUCTOR-LASERS
SUEMATSU, Y
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL,DEPT PHYS ELECTR,MEGURO KU,TOKYO 152,JAPAN
TOKYO INST TECHNOL,DEPT PHYS ELECTR,MEGURO KU,TOKYO 152,JAPAN
SUEMATSU, Y
AKIBA, S
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL,DEPT PHYS ELECTR,MEGURO KU,TOKYO 152,JAPAN
TOKYO INST TECHNOL,DEPT PHYS ELECTR,MEGURO KU,TOKYO 152,JAPAN
AKIBA, S
HONG, T
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL,DEPT PHYS ELECTR,MEGURO KU,TOKYO 152,JAPAN
TOKYO INST TECHNOL,DEPT PHYS ELECTR,MEGURO KU,TOKYO 152,JAPAN
HONG, T
[J].
IEEE JOURNAL OF QUANTUM ELECTRONICS,
1977,
13
(08)
: 596
-
600
[33]
SUPPRESSION OF RELAXATION OSCILLATION IN LIGHT OUTPUT OF INJECTION-LASERS BY ELECTRICAL RESONANCE CIRCUIT
SUEMATSU, Y
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL, DEPT PHYS ELECTR, TOKYO 152, JAPAN
SUEMATSU, Y
HONG, TH
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL, DEPT PHYS ELECTR, TOKYO 152, JAPAN
HONG, TH
[J].
IEEE JOURNAL OF QUANTUM ELECTRONICS,
1977,
13
(09)
: 756
-
762
[34]
SUSAKI W, 1976, OQE7630 SPEC GROUP I
[35]
RESISTIVITY MOBILITY AND IMPURITY LEVELS IN GAAS GE AND SI AT 300 DEGREES K
SZE, SM
论文数:
0
引用数:
0
h-index:
0
SZE, SM
IRVIN, JC
论文数:
0
引用数:
0
h-index:
0
IRVIN, JC
[J].
SOLID-STATE ELECTRONICS,
1968,
11
(06)
: 599
-
&
[36]
MEASUREMENTS OF LIFETIME IN GAAS DIODES
TAKUSAGAWA, M
论文数:
0
引用数:
0
h-index:
0
TAKUSAGAWA, M
FUNAYAMA, T
论文数:
0
引用数:
0
h-index:
0
FUNAYAMA, T
NISHIZAWA, J
论文数:
0
引用数:
0
h-index:
0
NISHIZAWA, J
DEMIZU, K
论文数:
0
引用数:
0
h-index:
0
DEMIZU, K
NAKANO, T
论文数:
0
引用数:
0
h-index:
0
NAKANO, T
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
(10)
: 4084
-
+
[37]
WATANABE Y, 1957, Patent No. 273217
←
1
2
3
4
→