PULSED MICROWAVE PLASMA-ETCHING OF POLYMERS IN OXYGEN AND NITROGEN FOR MICROELECTRONIC APPLICATIONS

被引:26
作者
LIN, TH
BELSER, M
TZENG, YH
机构
关键词
D O I
10.1109/27.16551
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
引用
收藏
页码:631 / 637
页数:7
相关论文
共 22 条
[1]   DESIGN CRITERIA FOR UNIFORM REACTION-RATES IN AN OXYGEN PLASMA [J].
BATTEY, JF .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1977, 24 (02) :140-146
[2]   SATURATION ION CURRENTS TO LANGMUIR PROBES [J].
CHEN, FF .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (3P1) :675-&
[3]  
CLEMENTS RM, 1978, J VAC SCI TECHNOL, V15, P193, DOI 10.1116/1.569453
[4]   POSITIVE-ION BOMBARDMENT OF SUBSTRATES IN RF DIODE GLOW-DISCHARGE SPUTTERING [J].
COBURN, JW ;
KAY, E .
JOURNAL OF APPLIED PHYSICS, 1972, 43 (12) :4965-4971
[5]   OPTICAL-EMISSION SPECTROSCOPY OF REACTIVE PLASMAS - A METHOD FOR CORRELATING EMISSION INTENSITIES TO REACTIVE PARTICLE DENSITY [J].
COBURN, JW ;
CHEN, M .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (06) :3134-3136
[6]   APPLICATION OF ELECTRON-PARAMAGNETIC-RES SPECTROSCOPY TO OXIDATIVE REMOVAL OF ORGANIC MATERIALS [J].
COOK, JM ;
BENSON, BW .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1983, 130 (12) :2459-2464
[7]   END-POINT DETERMINATION OF ALUMINUM CCL4 PLASMA ETCHING BY OPTICAL EMISSION-SPECTROSCOPY [J].
CURTIS, BJ ;
BRUNNER, HJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (05) :829-830
[8]   DECAPSULATION AND PHOTORESIST STRIPPING IN OXYGEN MICROWAVE PLASMAS [J].
DZIOBA, S ;
ESTE, G ;
NAGUIB, HM .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (11) :2537-2541
[9]  
Flamm D.L., 1981, PLASMA CHEM PLASMA P, V1, P317, DOI [10.1007/bf00565992, DOI 10.1007/BF00565992]
[10]   ION-ENHANCED GAS-SURFACE CHEMISTRY - THE INFLUENCE OF THE MASS OF THE INCIDENT ION [J].
GERLACHMEYER, U ;
COBURN, JW ;
KAY, E .
SURFACE SCIENCE, 1981, 103 (01) :177-188