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THE LONGITUDINAL DIFFUSION-COEFFICIENT AND THE MOBILITY OF HOT-ELECTRONS IN SILICON
被引:11
作者
:
BOSMAN, G
论文数:
0
引用数:
0
h-index:
0
BOSMAN, G
ZIJLSTRA, RJJ
论文数:
0
引用数:
0
h-index:
0
ZIJLSTRA, RJJ
NAVA, F
论文数:
0
引用数:
0
h-index:
0
NAVA, F
机构
:
来源
:
SOLID-STATE ELECTRONICS
|
1981年
/ 24卷
/ 01期
关键词
:
D O I
:
10.1016/0038-1101(81)90206-9
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:5 / 9
页数:5
相关论文
共 10 条
[1]
DRIFT AND DIFFUSION OF HOT HOLES IN SILICON
BOSMAN, G
论文数:
0
引用数:
0
h-index:
0
机构:
Fysisch Laboratorium, Rijksuniversiteit Utrecht
BOSMAN, G
ZIJLSTRA, RJJ
论文数:
0
引用数:
0
h-index:
0
机构:
Fysisch Laboratorium, Rijksuniversiteit Utrecht
ZIJLSTRA, RJJ
[J].
PHYSICS LETTERS A,
1979,
71
(5-6)
: 464
-
466
[2]
ELECTRON DRIFT VELOCITY IN SILICON
CANALI, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, MODENA, ITALY
UNIV MODENA, IST FIS, MODENA, ITALY
CANALI, C
JACOBONI, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, MODENA, ITALY
UNIV MODENA, IST FIS, MODENA, ITALY
JACOBONI, C
NAVA, F
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, MODENA, ITALY
UNIV MODENA, IST FIS, MODENA, ITALY
NAVA, F
OTTAVIANI, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, MODENA, ITALY
UNIV MODENA, IST FIS, MODENA, ITALY
OTTAVIANI, G
ALBERIGIQUARANTA, A
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, MODENA, ITALY
UNIV MODENA, IST FIS, MODENA, ITALY
ALBERIGIQUARANTA, A
[J].
PHYSICAL REVIEW B,
1975,
12
(06)
: 2265
-
2284
[3]
NOISE AND HOT CARRIER EFFECTS IN A SINGLE INJECTION SOLID-STATE DIODE
GISOLF, A
论文数:
0
引用数:
0
h-index:
0
机构:
RIJKS UNIV UTRECHT,FYS LAB,UTRECHT,NETHERLANDS
RIJKS UNIV UTRECHT,FYS LAB,UTRECHT,NETHERLANDS
GISOLF, A
ZIJLSTRA, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
RIJKS UNIV UTRECHT,FYS LAB,UTRECHT,NETHERLANDS
RIJKS UNIV UTRECHT,FYS LAB,UTRECHT,NETHERLANDS
ZIJLSTRA, RJ
[J].
SOLID-STATE ELECTRONICS,
1974,
17
(08)
: 839
-
841
[4]
SCATTERING NOISE OF HOT HOLES IN SPACE-CHARGE-LIMITED CURRENT FLOW IN P-TYPE SI
GISOLF, A
论文数:
0
引用数:
0
h-index:
0
机构:
RIJKS UNIV UTRECHT,FYS LAB,UTRECHT,NETHERLANDS
RIJKS UNIV UTRECHT,FYS LAB,UTRECHT,NETHERLANDS
GISOLF, A
ZIJLSTRA, RJJ
论文数:
0
引用数:
0
h-index:
0
机构:
RIJKS UNIV UTRECHT,FYS LAB,UTRECHT,NETHERLANDS
RIJKS UNIV UTRECHT,FYS LAB,UTRECHT,NETHERLANDS
ZIJLSTRA, RJJ
[J].
JOURNAL OF APPLIED PHYSICS,
1976,
47
(06)
: 2727
-
2734
[5]
LATTICE INTERACTION NOISE OF HOT CARRIERS IN SINGLE INJECTION SOLID-STATE DIODES
GISOLF, A
论文数:
0
引用数:
0
h-index:
0
机构:
FYS LAB RIJKS UNIV,UTRECHT,NETHERLANDS
FYS LAB RIJKS UNIV,UTRECHT,NETHERLANDS
GISOLF, A
ZIJLSTRA, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
FYS LAB RIJKS UNIV,UTRECHT,NETHERLANDS
FYS LAB RIJKS UNIV,UTRECHT,NETHERLANDS
ZIJLSTRA, RJ
[J].
SOLID-STATE ELECTRONICS,
1973,
16
(05)
: 571
-
580
[6]
REVIEW OF SOME CHARGE TRANSPORT PROPERTIES OF SILICON
JACOBONI, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, I-41100 MODENA, ITALY
UNIV MODENA, IST FIS, I-41100 MODENA, ITALY
JACOBONI, C
CANALI, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, I-41100 MODENA, ITALY
UNIV MODENA, IST FIS, I-41100 MODENA, ITALY
CANALI, C
OTTAVIANI, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, I-41100 MODENA, ITALY
UNIV MODENA, IST FIS, I-41100 MODENA, ITALY
OTTAVIANI, G
QUARANTA, AA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, I-41100 MODENA, ITALY
UNIV MODENA, IST FIS, I-41100 MODENA, ITALY
QUARANTA, AA
[J].
SOLID-STATE ELECTRONICS,
1977,
20
(02)
: 77
-
89
[7]
KITTEL G, 1961, INTRO SOLID STATE PH
[8]
ROLLAND M, 1975, THESIS U SCI TECHNIQ
[9]
SMITH RF, 1961, SEMICONDUCTORS
[10]
GENERATION-RECOMBINATION NOISE AT 77-DEGREES-K IN SILICON BARS AND JFETS
VANDERZIEL, A
论文数:
0
引用数:
0
h-index:
0
机构:
Electrical Engineering Department, University of Minnesota, Minneapolis
VANDERZIEL, A
JINDAL, R
论文数:
0
引用数:
0
h-index:
0
机构:
Electrical Engineering Department, University of Minnesota, Minneapolis
JINDAL, R
KIM, SK
论文数:
0
引用数:
0
h-index:
0
机构:
Electrical Engineering Department, University of Minnesota, Minneapolis
KIM, SK
PARK, H
论文数:
0
引用数:
0
h-index:
0
机构:
Electrical Engineering Department, University of Minnesota, Minneapolis
PARK, H
NOUGIER, JP
论文数:
0
引用数:
0
h-index:
0
机构:
Electrical Engineering Department, University of Minnesota, Minneapolis
NOUGIER, JP
[J].
SOLID-STATE ELECTRONICS,
1979,
22
(02)
: 177
-
179
←
1
→
共 10 条
[1]
DRIFT AND DIFFUSION OF HOT HOLES IN SILICON
BOSMAN, G
论文数:
0
引用数:
0
h-index:
0
机构:
Fysisch Laboratorium, Rijksuniversiteit Utrecht
BOSMAN, G
ZIJLSTRA, RJJ
论文数:
0
引用数:
0
h-index:
0
机构:
Fysisch Laboratorium, Rijksuniversiteit Utrecht
ZIJLSTRA, RJJ
[J].
PHYSICS LETTERS A,
1979,
71
(5-6)
: 464
-
466
[2]
ELECTRON DRIFT VELOCITY IN SILICON
CANALI, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, MODENA, ITALY
UNIV MODENA, IST FIS, MODENA, ITALY
CANALI, C
JACOBONI, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, MODENA, ITALY
UNIV MODENA, IST FIS, MODENA, ITALY
JACOBONI, C
NAVA, F
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, MODENA, ITALY
UNIV MODENA, IST FIS, MODENA, ITALY
NAVA, F
OTTAVIANI, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, MODENA, ITALY
UNIV MODENA, IST FIS, MODENA, ITALY
OTTAVIANI, G
ALBERIGIQUARANTA, A
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, MODENA, ITALY
UNIV MODENA, IST FIS, MODENA, ITALY
ALBERIGIQUARANTA, A
[J].
PHYSICAL REVIEW B,
1975,
12
(06)
: 2265
-
2284
[3]
NOISE AND HOT CARRIER EFFECTS IN A SINGLE INJECTION SOLID-STATE DIODE
GISOLF, A
论文数:
0
引用数:
0
h-index:
0
机构:
RIJKS UNIV UTRECHT,FYS LAB,UTRECHT,NETHERLANDS
RIJKS UNIV UTRECHT,FYS LAB,UTRECHT,NETHERLANDS
GISOLF, A
ZIJLSTRA, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
RIJKS UNIV UTRECHT,FYS LAB,UTRECHT,NETHERLANDS
RIJKS UNIV UTRECHT,FYS LAB,UTRECHT,NETHERLANDS
ZIJLSTRA, RJ
[J].
SOLID-STATE ELECTRONICS,
1974,
17
(08)
: 839
-
841
[4]
SCATTERING NOISE OF HOT HOLES IN SPACE-CHARGE-LIMITED CURRENT FLOW IN P-TYPE SI
GISOLF, A
论文数:
0
引用数:
0
h-index:
0
机构:
RIJKS UNIV UTRECHT,FYS LAB,UTRECHT,NETHERLANDS
RIJKS UNIV UTRECHT,FYS LAB,UTRECHT,NETHERLANDS
GISOLF, A
ZIJLSTRA, RJJ
论文数:
0
引用数:
0
h-index:
0
机构:
RIJKS UNIV UTRECHT,FYS LAB,UTRECHT,NETHERLANDS
RIJKS UNIV UTRECHT,FYS LAB,UTRECHT,NETHERLANDS
ZIJLSTRA, RJJ
[J].
JOURNAL OF APPLIED PHYSICS,
1976,
47
(06)
: 2727
-
2734
[5]
LATTICE INTERACTION NOISE OF HOT CARRIERS IN SINGLE INJECTION SOLID-STATE DIODES
GISOLF, A
论文数:
0
引用数:
0
h-index:
0
机构:
FYS LAB RIJKS UNIV,UTRECHT,NETHERLANDS
FYS LAB RIJKS UNIV,UTRECHT,NETHERLANDS
GISOLF, A
ZIJLSTRA, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
FYS LAB RIJKS UNIV,UTRECHT,NETHERLANDS
FYS LAB RIJKS UNIV,UTRECHT,NETHERLANDS
ZIJLSTRA, RJ
[J].
SOLID-STATE ELECTRONICS,
1973,
16
(05)
: 571
-
580
[6]
REVIEW OF SOME CHARGE TRANSPORT PROPERTIES OF SILICON
JACOBONI, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, I-41100 MODENA, ITALY
UNIV MODENA, IST FIS, I-41100 MODENA, ITALY
JACOBONI, C
CANALI, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, I-41100 MODENA, ITALY
UNIV MODENA, IST FIS, I-41100 MODENA, ITALY
CANALI, C
OTTAVIANI, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, I-41100 MODENA, ITALY
UNIV MODENA, IST FIS, I-41100 MODENA, ITALY
OTTAVIANI, G
QUARANTA, AA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, IST FIS, I-41100 MODENA, ITALY
UNIV MODENA, IST FIS, I-41100 MODENA, ITALY
QUARANTA, AA
[J].
SOLID-STATE ELECTRONICS,
1977,
20
(02)
: 77
-
89
[7]
KITTEL G, 1961, INTRO SOLID STATE PH
[8]
ROLLAND M, 1975, THESIS U SCI TECHNIQ
[9]
SMITH RF, 1961, SEMICONDUCTORS
[10]
GENERATION-RECOMBINATION NOISE AT 77-DEGREES-K IN SILICON BARS AND JFETS
VANDERZIEL, A
论文数:
0
引用数:
0
h-index:
0
机构:
Electrical Engineering Department, University of Minnesota, Minneapolis
VANDERZIEL, A
JINDAL, R
论文数:
0
引用数:
0
h-index:
0
机构:
Electrical Engineering Department, University of Minnesota, Minneapolis
JINDAL, R
KIM, SK
论文数:
0
引用数:
0
h-index:
0
机构:
Electrical Engineering Department, University of Minnesota, Minneapolis
KIM, SK
PARK, H
论文数:
0
引用数:
0
h-index:
0
机构:
Electrical Engineering Department, University of Minnesota, Minneapolis
PARK, H
NOUGIER, JP
论文数:
0
引用数:
0
h-index:
0
机构:
Electrical Engineering Department, University of Minnesota, Minneapolis
NOUGIER, JP
[J].
SOLID-STATE ELECTRONICS,
1979,
22
(02)
: 177
-
179
←
1
→