共 11 条
[1]
ION-IMPLANTED, ELECTRON-BEAM ANNEALED TIN FILMS AS DIFFUSION-BARRIERS FOR AL ON SI SHALLOW JUNCTIONS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1985, 3 (06)
:2237-2241
[2]
SIMULTANEOUS NUCLEAR MICROANALYSIS OF NITROGEN AND OXYGEN ON SILICON
[J].
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH,
1982, 201 (2-3)
:473-479
[4]
CRACIUN V, 1988, APPL PHYS LETT, V52, P1225, DOI 10.1063/1.99674
[5]
LASER SYNTHESIS OF METAL SILICIDES
[J].
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING,
1988, 45 (04)
:325-335
[8]
Tang T., 1985, International Electron Devices Meeting. Technical Digest (Cat. No. 85CH2252-5), P590
[10]
PROPERTIES AND MICROELECTRONIC APPLICATIONS OF THIN-FILMS OF REFRACTORY-METAL NITRIDES
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1985, 3 (04)
:1797-1803