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EVOLUTION OF DIGITAL ELECTRONICS TOWARDS VLSI
被引:23
作者
:
KEYES, RW
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Thomas J. Watson Research Center
KEYES, RW
机构
:
[1]
IBM Thomas J. Watson Research Center
来源
:
IEEE JOURNAL OF SOLID-STATE CIRCUITS
|
1979年
/ 14卷
/ 02期
关键词
:
D O I
:
10.1109/JSSC.1979.1051164
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
Technological trends are extrapolated to the end of this century. Problems of utilizing high levels of integration are noted, and the capabilities of technology are viewed in the perspective of the problems to provide a forecast of the levels of integration that will be found in large computing systems. A physical model and some more speculative system assumptions are used to estimate the performance of the systems. The physical characteristics forecast for the system are summarized. Copyright © 1979 by The Institute of Electrical and Electronics Engineers, Inc.
引用
收藏
页码:193 / 201
页数:9
相关论文
共 22 条
[1]
HOT-CARRIER INSTABILITY IN IGFETS
ABBAS, SA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
ABBAS, SA
DOCKERTY, RC
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
DOCKERTY, RC
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(03)
: 147
-
148
[2]
COMPONENT PROGRESS - ITS EFFECT ON HIGH-SPEED COMPUTER ARCHITECTURE AND MACHINE ORGANIZATION
BLOCH, E
论文数:
0
引用数:
0
h-index:
0
BLOCH, E
GALAGE, D
论文数:
0
引用数:
0
h-index:
0
GALAGE, D
[J].
COMPUTER,
1978,
11
(04)
: 64
-
76
[3]
EXCESS CURRENT GENERATION DUE TO REVERSE BIAS P-N JUNCTION STRESS
COLLINS, DR
论文数:
0
引用数:
0
h-index:
0
COLLINS, DR
[J].
APPLIED PHYSICS LETTERS,
1968,
13
(08)
: 264
-
&
[4]
DONATH WE, UNPUBLISHED
[5]
HELLER WR, 1977, 14TH P IEEE DES AUT, P32
[6]
FUNDAMENTAL LIMITATIONS IN MICROELECTRONICS .1. MOS TECHNOLOGY
HOENEISEN, B
论文数:
0
引用数:
0
h-index:
0
HOENEISEN, B
MEAD, CA
论文数:
0
引用数:
0
h-index:
0
MEAD, CA
[J].
SOLID-STATE ELECTRONICS,
1972,
15
(07)
: 819
-
+
[7]
HOENEISEN B, 1972, SOLID STATE ELECTRON, V15, P981
[8]
FIGURE OF MERIT FOR IC PACKAGING
KEYES, RW
论文数:
0
引用数:
0
h-index:
0
KEYES, RW
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1978,
13
(02)
: 265
-
266
[9]
PHYSICAL LIMITS IN SEMICONDUCTOR ELECTRONICS
KEYES, RW
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
KEYES, RW
[J].
SCIENCE,
1977,
195
(4283)
: 1230
-
1235
[10]
PIN VERSUS BLOCK RELATIONSHIP FOR PARTITIONS OF LOGIC GRAPHS
LANDMAN, BS
论文数:
0
引用数:
0
h-index:
0
LANDMAN, BS
RUSSO, RL
论文数:
0
引用数:
0
h-index:
0
RUSSO, RL
[J].
IEEE TRANSACTIONS ON COMPUTERS,
1971,
C 20
(12)
: 1469
-
&
←
1
2
3
→
共 22 条
[1]
HOT-CARRIER INSTABILITY IN IGFETS
ABBAS, SA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
ABBAS, SA
DOCKERTY, RC
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
DOCKERTY, RC
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(03)
: 147
-
148
[2]
COMPONENT PROGRESS - ITS EFFECT ON HIGH-SPEED COMPUTER ARCHITECTURE AND MACHINE ORGANIZATION
BLOCH, E
论文数:
0
引用数:
0
h-index:
0
BLOCH, E
GALAGE, D
论文数:
0
引用数:
0
h-index:
0
GALAGE, D
[J].
COMPUTER,
1978,
11
(04)
: 64
-
76
[3]
EXCESS CURRENT GENERATION DUE TO REVERSE BIAS P-N JUNCTION STRESS
COLLINS, DR
论文数:
0
引用数:
0
h-index:
0
COLLINS, DR
[J].
APPLIED PHYSICS LETTERS,
1968,
13
(08)
: 264
-
&
[4]
DONATH WE, UNPUBLISHED
[5]
HELLER WR, 1977, 14TH P IEEE DES AUT, P32
[6]
FUNDAMENTAL LIMITATIONS IN MICROELECTRONICS .1. MOS TECHNOLOGY
HOENEISEN, B
论文数:
0
引用数:
0
h-index:
0
HOENEISEN, B
MEAD, CA
论文数:
0
引用数:
0
h-index:
0
MEAD, CA
[J].
SOLID-STATE ELECTRONICS,
1972,
15
(07)
: 819
-
+
[7]
HOENEISEN B, 1972, SOLID STATE ELECTRON, V15, P981
[8]
FIGURE OF MERIT FOR IC PACKAGING
KEYES, RW
论文数:
0
引用数:
0
h-index:
0
KEYES, RW
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1978,
13
(02)
: 265
-
266
[9]
PHYSICAL LIMITS IN SEMICONDUCTOR ELECTRONICS
KEYES, RW
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
KEYES, RW
[J].
SCIENCE,
1977,
195
(4283)
: 1230
-
1235
[10]
PIN VERSUS BLOCK RELATIONSHIP FOR PARTITIONS OF LOGIC GRAPHS
LANDMAN, BS
论文数:
0
引用数:
0
h-index:
0
LANDMAN, BS
RUSSO, RL
论文数:
0
引用数:
0
h-index:
0
RUSSO, RL
[J].
IEEE TRANSACTIONS ON COMPUTERS,
1971,
C 20
(12)
: 1469
-
&
←
1
2
3
→