STUDY OF CHARGE TRAPPING IN THE AL-AL2O3-SI, MIS SYSTEM

被引：6

作者：

KOLK, J ^{[1
]}

HEASELL, EL ^{[1
]}

机构：

[1] UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA

来源：

SOLID-STATE ELECTRONICS | 1980年 / 23卷 / 02期

关键词：

D O I：

10.1016/0038-1101(80)90143-4

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：101 / &

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