APPLICATION OF RUTHERFORD SCATTERING AND CHANNELING TECHNIQUES TO STUDY SEMICONDUCTOR SURFACES

被引：19

作者：

MORGAN, DV

BOGH, E

机构：

来源：

SURFACE SCIENCE | 1972年 / 32卷 / 02期

关键词：

D O I：

10.1016/0039-6028(72)90159-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：278 / &

共 11 条

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