POTENTIAL OF AMORPHOUS MATERIALS AS CATALYSTS

[41] DELGASS WN, 1970, CATALY REV, V4, P179

[42] CATALYTIC ACTIVITY OF NICKEL - THEORETICAL ASPECTS [J]. INDUSTRIAL AND ENGINEERING CHEMISTRY, 1952, 44 (05): : 977 - 985

[43] PHOTOEMISSION ENERGY-LEVEL MEASUREMENTS OF CHEMISORBED CO AND O ON NI [J]. PHYSICAL REVIEW LETTERS, 1971, 27 (22) : 1520 - &

[44] THE INFRARED SPECTRA OF ADSORBED MOLECULES [J]. ADVANCES IN CATALYSIS, 1958, 10 : 1 - 56

[45] Ertl G., 1979, The nature of the surface chemical bond, P315

[46] SECONDARY ION MASS ANALYSIS - TECHNIQUE FOR 3-DIMENSIONAL CHARACTERIZATION [J]. ANALYTICAL CHEMISTRY, 1972, 44 (13) : A67 - &

[47] Fadley C. S., 1976, Progress in Solid State Chemistry, V11, P265, DOI 10.1016/0079-6786(76)90013-3

[48] INSTRUMENTATION FOR SURFACE STUDIES - XPS ANGULAR-DISTRIBUTIONS [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) : 725 - 754

[49] A THEORY OF VACUUM TUNNELING MICROSCOPY [J]. PHYSICS LETTERS A, 1983, 99 (04) : 167 - 171

[50] VOLTAGE DROP IN THE EXPERIMENTS OF SCANNING TUNNELING MICROSCOPY FOR SI [J]. PHYSICAL REVIEW B, 1984, 30 (04): : 2289 - 2291

[41] DELGASS WN, 1970, CATALY REV, V4, P179

[42] CATALYTIC ACTIVITY OF NICKEL - THEORETICAL ASPECTS [J]. INDUSTRIAL AND ENGINEERING CHEMISTRY, 1952, 44 (05): : 977 - 985

[43] PHOTOEMISSION ENERGY-LEVEL MEASUREMENTS OF CHEMISORBED CO AND O ON NI [J]. PHYSICAL REVIEW LETTERS, 1971, 27 (22) : 1520 - &

[44] THE INFRARED SPECTRA OF ADSORBED MOLECULES [J]. ADVANCES IN CATALYSIS, 1958, 10 : 1 - 56

[45] Ertl G., 1979, The nature of the surface chemical bond, P315

[46] SECONDARY ION MASS ANALYSIS - TECHNIQUE FOR 3-DIMENSIONAL CHARACTERIZATION [J]. ANALYTICAL CHEMISTRY, 1972, 44 (13) : A67 - &

[47] Fadley C. S., 1976, Progress in Solid State Chemistry, V11, P265, DOI 10.1016/0079-6786(76)90013-3

[48] INSTRUMENTATION FOR SURFACE STUDIES - XPS ANGULAR-DISTRIBUTIONS [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) : 725 - 754

[49] A THEORY OF VACUUM TUNNELING MICROSCOPY [J]. PHYSICS LETTERS A, 1983, 99 (04) : 167 - 171

[50] VOLTAGE DROP IN THE EXPERIMENTS OF SCANNING TUNNELING MICROSCOPY FOR SI [J]. PHYSICAL REVIEW B, 1984, 30 (04): : 2289 - 2291