GROWTH AND ANNEALING OF TRAPPED HOLES AND INTERFACE STATES USING TIME-DEPENDENT BIASES

被引:26
作者
FREITAG, RK
DOZIER, CM
BROWN, DB
机构
关键词
D O I
10.1109/TNS.1987.4337448
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:1172 / 1177
页数:6
相关论文
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