A STUDY OF THE BREAKDOWN OF FRIEDEL LAW IN ELECTRON BACKSCATTER KIKUCHI DIFFRACTION PATTERNS - APPLICATION TO ZINCBLENDE-TYPE STRUCTURES

被引:23
作者
BABAKISHI, KZ [1 ]
机构
[1] UNIV BRISTOL,HH WILLS PHYS LAB,BRISTOL BS8 1TL,AVON,ENGLAND
关键词
D O I
10.1107/S0021889890010147
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The breakdown of Friedel's law has been observed in backscatter Kikuchi diffraction patterns (BKDP) obtained in the scanning electron microscope (SEM) from a series of zincblende structures including GaAs, InP, GaSb, CdHgTe and the minerals sphalerite (ZnS), chalcopyrite (CuFeS2) and tetrahedrite (Cu12Sb4S13). Differences in intensities were observed between the reflections 51BAR1 and 5BAR1BAR1 in InP, GaSb, CdHgTe and sphalerite, thus allowing the non-centrosymmetric point group BAR43m to be determined. In GaAs, differences in intensities were noted between BAR511 and BAR5BAR11. In chalcopyrite and tetrahedrite, non-equivalent intensities were observed between BAR215 and 2BAR1BAR5 and between 3BAR1BAR2 and 31BAR2, respectively. In addition, BKDPs obtained from chalcopyrite revealed a small displacement at the point where the pair of equivalent reflections BAR406 and 460 intersect within the Kikuchi band 02BAR2. The presence of this displacement together with observation of the breakdown of Friedel's law confirmed the tetragonal point group BAR42m for chalcopyrite. Although the point groups of GaAs, chalcopyrite and tetrahedrite were derived successfully using BKDPs, determination of their space groups proved unsuccessful. The superstructure reflections were invisible because the structure factors are very small. The behaviour of the invisible 200 reflection in GaAs is investigated using many-beam dynamical intensity profiles calculated across the h00 systematic row of reflections. Dynamical intensity profiles calculated across the h00 systematic rows of reflections for Ge, InP and sphalerite are also discussed.
引用
收藏
页码:38 / 47
页数:10
相关论文
共 15 条
[1]   BACKSCATTER KIKUCHI DIFFRACTION IN THE SEM FOR IDENTIFICATION OF CRYSTALLOGRAPHIC POINT GROUPS [J].
BABAKISHI, KZ ;
DINGLEY, DJ .
SCANNING, 1989, 11 (06) :305-312
[2]   APPLICATION OF BACKSCATTER KIKUCHI DIFFRACTION IN THE SCANNING ELECTRON-MICROSCOPE TO THE STUDY OF NIS2 [J].
BABAKISHI, KZ ;
DINGLEY, DJ .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1989, 22 :189-200
[3]  
BABAKISHI KZ, 1990, IN PRESS ULTRAMICROS
[4]  
BABAKISHI KZ, 1987, I PHYS C SER, V90, P135
[5]   A SCANNING ELECTRON-MICROSCOPE STAGE FOR CRYSTAL ORIENTATION AND STRUCTURE DETERMINATION [J].
BENNETT, BW ;
PICKERING, HW .
SCRIPTA METALLURGICA, 1984, 18 (07) :743-748
[6]  
BRAGG L, 1965, CRYSTAL STRUCTURE MI
[7]  
Friedel G, 1913, CR HEBD ACAD SCI, V157, P1533
[8]   OBSERVATION OF BREAKDOWN OF FRIEDELS LAW IN ELECTRON DIFFRACTION AND SYMMETRY DETERMINATION FROM ZERO-LAYER INTERACTIONS [J].
GOODMAN, P ;
LEHMPFUHL, G .
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :339-+
[9]   RAPID DETERMINATION OF POLARITY SENSE BY AN ENERGY-DISPERSIVE DIFFRACTOMETER [J].
HOSOYA, S ;
FUKAMACH.T .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (OCT1) :396-399
[10]   DETERMINATION OF CRYSTAL SYMMETRY FROM ELECTRON CHANNELING PATTERNS [J].
MARTHINSEN, K ;
HOIER, R .
ACTA CRYSTALLOGRAPHICA SECTION A, 1988, 44 :693-700