THE GENERAL TRANSIENT CHARGE CONTROL RELATION - A NEW CHARGE CONTROL RELATION FOR SEMICONDUCTOR-DEVICES

被引:19
作者
HAMEL, JS
SELVAKUMAR, CR
机构
[1] Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, Ont.
基金
加拿大自然科学与工程研究理事会;
关键词
D O I
10.1109/16.81640
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new charge control relation, the General Transient Charge Control (GTCC) relation, is developed and shown to be a natural extension to conventional charge control theory by correctly accounting for the partitioning of stored charge within semiconductor devices. Although the Transient Integral Charge Control (TICC) relation was originally thought to represent such an extension, it is shown that the TICC relation neglects the influence of recombination on the displacement components of the non-quasi-static (NQS) currents, and is therefore, only a special case of the GTCC relation. From the GTCC relation, a physically based weighting function emerges which is shown to be the optimum weighting function with which to weight the continuity equation in the Generalized Partitioned-Charge-Based (PCB) modeling methodology. Application of the GTCC relation to the quasi-neutral emitter region of bipolar transistors leads to the development of an extended TICC relation that is valid for transparent emitters with widely varying emitter surface recombination velocities. Also, a new charge control relation for the emitter is developed which yields a semi-analytic expression, involving the static minority-carrier charge distribution, for calculating the optimum charge partitioning in arbitrarily doped emitters. The TICC, the extended TICC, and GTCC relations are compared with accurate ac numerical calculations of charge partitioning in a wide variety of Gaussian emitter profiles.
引用
收藏
页码:1467 / 1476
页数:10
相关论文
共 18 条
[1]   NON-QUASI-STATIC SMALL-SIGNAL MODELS FOR SEMICONDUCTOR JUNCTION DIODES WITH EXTENSIONS FOR TRANSISTORS [J].
CHEN, MK ;
LINDHOLM, FA ;
JUNG, TW .
SOLID-STATE ELECTRONICS, 1987, 30 (08) :883-885
[2]   COMPARISON AND EXTENSION OF RECENT ONE-DIMENSIONAL BIPOLAR-TRANSISTOR MODELS [J].
CHEN, MK ;
LINDHOLM, FA ;
WU, BS .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1988, 35 (07) :1096-1106
[3]  
del Alamo J., 1985, International Electron Devices Meeting. Technical Digest (Cat. No. 85CH2252-5), P290
[4]   THE PHYSICS AND MODELING OF HEAVILY DOPED EMITTERS [J].
DELALAMO, JA ;
SWANSON, RM .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (12) :1878-1888
[5]   PARTITIONED-CHARGE-BASED MODELING OF BIPOLAR-TRANSISTORS FOR NON-QUASI-STATIC CIRCUIT SIMULATION [J].
FOSSUM, JG ;
VEERARAGHAVAN, S .
IEEE ELECTRON DEVICE LETTERS, 1986, 7 (12) :652-654
[6]  
GETREU IE, 1978, MODELING BIPOLAR TRA
[7]  
HAMEL JS, 1989, THESIS U WATERLOO WA
[8]   A NEW APPROACH TO AC CHARACTERIZATION OF BIPOLAR-TRANSISTORS [J].
HURKX, GAM .
SOLID-STATE ELECTRONICS, 1988, 31 (08) :1269-1275
[9]   THE TRANSIENT INTEGRAL CHARGE CONTROL RELATION - A NOVEL FORMULATION OF THE CURRENTS IN A BIPOLAR-TRANSISTOR [J].
KLOSE, H ;
WIEDER, AW .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1987, 34 (05) :1090-1099
[10]   TECHNIQUES FOR SMALL-SIGNAL ANALYSIS OF SEMICONDUCTOR-DEVICES [J].
LAUX, SE .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (10) :2028-2037