STUDY OF THE INTERDIFFUSION OF GAAS-ALGAAS INTERFACES DURING RAPID THERMAL ANNEALING OF ION-IMPLANTED STRUCTURES

被引:26
作者
KAHEN, KB
RAJESWARAN, G
机构
关键词
D O I
10.1063/1.343571
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:545 / 551
页数:7
相关论文
共 29 条
[1]   ELECTRON AND PHONON SCATTERING IN GAAS AT HIGH TEMPERATURES [J].
AMITH, A ;
KUDMAN, I ;
STEIGMEIER, EF .
PHYSICAL REVIEW, 1965, 138 (4A) :1270-+
[2]   DEFECTS INTRODUCED IN SILICON-WAFERS DURING RAPID ISOTHERMAL ANNEALING - THERMOELASTIC AND THERMOPLASTIC EFFECTS [J].
BENTINI, G ;
CORRERA, L ;
DONOLATO, C .
JOURNAL OF APPLIED PHYSICS, 1984, 56 (10) :2922-2929
[3]   ANALYSIS OF THERMAL-STRESSES INDUCED IN SILICON DURING XENON ARC LAMP FLASH ANNEALING [J].
BENTINI, GG ;
CORRERA, L .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (04) :2057-2062
[5]   SEMICONDUCTING AND OTHER MAJOR PROPERTIES OF GALLIUM-ARSENIDE [J].
BLAKEMORE, JS .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (10) :R123-R181
[6]  
BLOEMBERGEN N, 1986, MATER RES SOC S P, V51, P3
[7]   CRYSTALLOGRAPHIC SLIP IN GAAS WAFERS ANNEALED USING INCOHERENT RADIATION [J].
BLUNT, RT ;
LAMB, MSM ;
SZWEDA, R .
APPLIED PHYSICS LETTERS, 1985, 47 (03) :304-306
[8]   INTERDIFFUSION BETWEEN GAAS AND ALAS [J].
CHANG, LL ;
KOMA, A .
APPLIED PHYSICS LETTERS, 1976, 29 (03) :138-141
[9]   PROPERTIES OF VACANCY DEFECTS IN GAAS SINGLE-CRYSTALS [J].
CHIANG, SY ;
PEARSON, GL .
JOURNAL OF APPLIED PHYSICS, 1975, 46 (07) :2986-2991
[10]   COMPUTER SOLUTIONS TO SCHRODINGER EQUATION [J].
CHOW, PC .
AMERICAN JOURNAL OF PHYSICS, 1972, 40 (05) :730-&