EXPERIMENTAL-EVIDENCE OF THE CROSSOVER BETWEEN BULK AND THIN-FILM OPTICS

被引：10

作者：

BORGHESI, A ^{[1
]}

SASSELLA, A ^{[1
]}

机构：

[1] UNIV PAVIA, DIPARTIMENTO FIS A VOLTA, I-27100 PAVIA, ITALY

来源：

PHYSICAL REVIEW B | 1994年 / 50卷 / 23期

关键词：

D O I：

10.1103/PhysRevB.50.17756

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The low-energy optical response of few-nanometer-thick SiO2 films is reported and compared with theoretical predictions. The limit where the surface effects become fundamental in determining the optical properties of the film is discussed and very good agreement is found between experimental and theoretical results. © 1994 The American Physical Society.

引用

页码：17756 / 17758

页数：3

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