DC CHARACTERISTICS OF MOS STRUCTURES AND HOPPING CURRENTS IN THERMALLY GROWN SIO2-FILMS

被引：6

作者：

KRAUSE, H

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1982年 / 72卷 / 02期

关键词：

D O I：

10.1002/pssa.2210720222

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：607 / 616

页数：10

共 27 条

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