COMPARISON OF SCHOTTKY-BARRIER AND DIFFUSED JUNCTION INFRARED DETECTORS

被引:13
作者
GUPTA, SC
SHARMA, BL
AGASHE, VV
机构
[1] Solid State Physics Laboratory, Delhi
来源
INFRARED PHYSICS | 1979年 / 19卷 / 05期
关键词
D O I
10.1016/0020-0891(79)90071-X
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The resistance-area product (RoA) of Schottky barrier and n-p diffused junction infrared detectors of PbSnTe, PbSnSe and HgCdTe under conditions of zero bias have been calculated over the temperature range of 50-200 K. The calculations are restricted to carrier concentrations in which Auger band-to-band recombination mechanism is predominant. A comparison of the detectivities, D,′ and the depletion layer capacitance per unit area, (C/A), of various diodes has been made at 77K. The results indicate that even though n-p diffused PbSnTe and PbSnSe photodiodes have higher detectivities, their Schottky barrier diodes too have detectivities more than 1011 Cm Hz 1 2/W. The calculated value of the detectivity of HgCdTe Schottky barrier photodiode, however, turns out to be an order less. © 1979.
引用
收藏
页码:545 / 548
页数:4
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