IGBT模块寿命预测方法研究综述

被引：47

作者：

唐圣学 ^{[1
,2
]}

张继欣 ^{[1
,2
]}

姚芳 ^{[1
,2
]}

马强 ^{[1
,2
]}

机构：

[1] 省部共建电工装备可靠性与智能化国家重点实验室(河北工业大学电气工程学院)

[2] 河北省电磁场与电器可靠性重点实验室(河北工业大学电气工程学院)

来源：

电源学报 | 2023年 / 21卷 / 01期

关键词：

绝缘栅双极型晶体管; 解析模型; 物理模型; 数据驱动; 寿命预测;

D O I：

暂无

中图分类号：

TN322.8 [];

学科分类号：

摘要：

绝缘栅双极型晶体管IGBT(insulated gate bipolar transistor)模块在高压大功率电能转换领域具有广泛应用，在这些领域人们对IGBT模块可靠性提出了更高的要求。首先归纳预测了IGBT模块及其模块市场规模与需求。然后从寿命预测机理角度，将IGBT模块预测方法归类为基于模型的预测方法和数据驱动的预测方法两大类，对每类的研究现状、基本原理、预测过程实施、适用范围和优缺点进行了分析、总结与归纳。最后统计分析了近十年研究成果，并讨论了IGBT模块寿命预测方法发展趋势。

引用

收藏

页码：177 / 194

页数：18

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共 36 条

[1]

Stress-Based Model for Lifetime Estimation of Bond Wire Contacts Using Power Cycling Tests and Finite-Element Modeling [J].

Dornic, Nausicaa ;

Khatir, Zoubir ;

Son Ha Tran ;

Ibrahim, Ali ;

Lallemand, Richard ;

Ousten, Jean-Pierre ;

Ewanchuk, Jeffrey ;

Mollov, Stefan, V .

IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, 2019, 7 (03) :1659-1667

[2]

Experimental Investigation of Linear Cumulative Damage Theory With Power Cycling Test [J].

Zeng, Guang ;

Herold, Christian ;

Methfessel, Torsten ;

Schaefer, Marc ;

Schilling, Oliver ;

Lutz, Josef .

IEEE TRANSACTIONS ON POWER ELECTRONICS, 2019, 34 (05) :4722-4728

[3]

Lifetime Prediction of IGBT Modules in Suspension Choppers of Medium/Low-Speed Maglev Train Using an Energy-Based Approach [J].

Yang, Xin ;

Lin, Zhikai ;

Ding, Jingfang ;

Long, Zhiqiang .

IEEE TRANSACTIONS ON POWER ELECTRONICS, 2019, 34 (01) :738-747

[4]

Auxiliary Particle Filtering-Based Estimation of Remaining Useful Life of IGBT [J].

Haque, Moinul Shahidul ;

Choi, Seungdeog ;

Baek, Jeihoon .

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2018, 65 (03) :2693-2703

[5]

IGBT History, State-of-the-Art, and Future Prospects [J].

Iwamuro, Noriyuki ;

Laska, Thomas .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017, 64 (03) :741-752

[6]

Prediction of Bond Wire Fatigue of IGBTs in a PV Inverter Under a Long-Term Operation [J].

Reigosa, Paula Diaz ;

Wang, Huai ;

Yang, Yongheng ;

Blaabjerg, Frede .

IEEE TRANSACTIONS ON POWER ELECTRONICS, 2016, 31 (10) :7171-7182

[7]

Stochastic RUL Calculation Enhanced With TDNN-Based IGBT Failure Modeling [J].

Alghassi, Alireza ;

Perinpanayagam, Suresh ;

Samie, Mohammad .

IEEE TRANSACTIONS ON RELIABILITY, 2016, 65 (02) :558-573

[8]

Probabilistic Monte-Carlo Method for Modelling and Prediction of Electronics Component Life [J].

Sreenuch, T. ;

Alghassi, A. ;

Perinpanayagam, S. ;

Xie, Y. .

INTERNATIONAL JOURNAL OF ADVANCED COMPUTER SCIENCE AND APPLICATIONS, 2014, 5 (01) :96-104

[9]

A study on IGBT junction temperature (Tj) online estimation using gate-emitter voltage (Vge) at turn-off [J].

Sundaramoorthy, V. K. ;

Bianda, E. ;

Bloch, R. ;

Angelosante, D. ;

Nistor, I. ;

Zurfluh, F. ;

Knapp, G. ;

Heinemann, A. .

MICROELECTRONICS RELIABILITY, 2014, 54 (11) :2423-2431

[10]

Approach of a physically based lifetime model for solder layers in power modules [J].

Steinhorst, P. ;

Poller, T. ;

Lutz, J. .

MICROELECTRONICS RELIABILITY, 2013, 53 (9-11) :1199-1202

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