Femtosecond carrier-induced screening of dc electric-field-induced second-harmonic generation at the Si(001)-SiO2 interface

被引:52
作者
Dadap, JI
Wilson, PT
Anderson, MH
Downer, MC
terBeek, M
机构
[1] UNIV TEXAS,DEPT PHYS,AUSTIN,TX 78712
[2] UNIV TEXAS,DEPT CHEM,AUSTIN,TX 78712
关键词
D O I
10.1364/OL.22.000901
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Carrier-induced screening of the dc electric field at the Si(001)-SiO2 interface is observed by intensity-dependent and femtosecond-time-resolved second-harmonic spectroscopy. The screening occurs on a time scale of similar to omega(p)(-1), the reciprocal plasma frequency of the generated carriers. (C) 1997 Optical Society of America.
引用
收藏
页码:901 / 903
页数:3
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