ZrO2-In2O3 thin layers with gradual ionic to electronic composition synthesized by atomic layer deposition for SOFC applications

被引:28
作者
Brahim, Cyrine [1 ]
Chauveau, Florent [1 ]
Ringuede, Armelle [1 ]
Cassir, Michel [1 ]
Putkonen, Matti [2 ]
Niinistoe, Lauri [2 ]
机构
[1] ENSCP, CNRS, Lab Electrochim & Chim Analyt, UMR 7575, F-75231 Paris 05, France
[2] Helsinki Univ Technol TKK, Inorgan & Analyt Chem Lab, FI-02015 Espoo, Finland
关键词
ELECTRICAL-PROPERTIES; FUEL-CELLS; FILMS; EPITAXY; GROWTH; PRECURSORS; ZRO2;
D O I
10.1039/b813001a
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
To achieve the processing of high performance solid oxide fuel cells (SOFCs) operating in the intermediate-temperature range (600-750 degrees C), either a thin layer electrolyte configuration or development of a new electrolyte material with high ionic conductivity is needed. In this work, atomic layer deposition, ALD, was used to process at 300 degrees C ZrO2-In2O3 thin layers which can be mixed ionic and/or electronic conductors depending on the amount of indium oxide. Single thin layers with different compositions and a thin multilayer with a composition gradient were deposited. The structural and morphological properties were analyzed by SEM/EDX and XRD. The deposits were well-crystallized without post-deposition annealing. Impedance spectroscopy measurements showed that the ZrO2-In2O3 gradient of composition seems to improve the interface properties.
引用
收藏
页码:760 / 766
页数:7
相关论文
共 21 条
[1]   GROWTH OF IN2O3 THIN-FILMS BY ATOMIC LAYER EPITAXY [J].
ASIKAINEN, T ;
RITALA, M ;
LESKELA, M .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1994, 141 (11) :3210-3213
[2]   Atomic layer deposition growth of zirconium doped In2O3 films [J].
Asikainen, T ;
Ritala, M ;
Leskelä, M .
THIN SOLID FILMS, 2003, 440 (1-2) :152-154
[3]   Yttria-doped zirconia thin films deposited by atomic layer deposition ALD:: a structural, morphological and electrical characterisation [J].
Bernay, C ;
Ringuedé, A ;
Colomban, P ;
Lincot, D ;
Cassir, M .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2003, 64 (9-10) :1761-1770
[4]   Electrical properties of thin yttria-stabilized zirconia overlayers produced by atomic layer deposition for solid oxide fuel cell applications [J].
Brahim, C. ;
Ringuede, A. ;
Cassir, M. ;
Putkonen, M. ;
Niinisto, L. .
APPLIED SURFACE SCIENCE, 2007, 253 (08) :3962-3968
[5]  
BRAHIM C, 2007, ECS T, V15, P261
[6]   Synthesis of ZrO2 thin films by atomic layer deposition:: growth kinetics, structural and electrical properties [J].
Cassir, M ;
Goubin, F ;
Bernay, C ;
Vernoux, P ;
Lincot, D .
APPLIED SURFACE SCIENCE, 2002, 193 (1-4) :120-128
[7]   VOLATILE RARE EARTH CHELATES [J].
EISENTRAUT, KJ ;
SIEVERS, RE .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1965, 87 (22) :5254-+
[8]   IONIC AND ELECTRONIC CONDUCTIVITIES OF HOMOGENEOUS AND HETEROGENEOUS MATERIALS IN THE SYSTEM ZRO2-IN2O3 [J].
GAUCKLER, LJ ;
SASAKI, K .
SOLID STATE IONICS, 1995, 75 :203-210
[9]   Characterisation of thin films of ceria-based electrolytes for IntermediateTemperature -: Solid oxide fuel cells (IT-SOFC) [J].
Gourba, E ;
Ringuedé, A ;
Cassir, M ;
Billard, A ;
Päiviäsaari, J ;
Niinistö, J ;
Putkonen, M ;
Niinistö, L .
IONICS, 2003, 9 (1-2) :15-20
[10]   Synthesis and surface engineering of complex nanostructures by atomic layer deposition [J].
Knez, Mato ;
Niesch, Kornelius ;
Niinistoe, Lauri .
ADVANCED MATERIALS, 2007, 19 (21) :3425-3438