MOCVD of ZrO2 and HfO2 thin films from modified monomeric precursors

被引:18
作者
Patil, U
Thomas, R
Milanov, A
Bhakta, R
Ehrhart, P
Waser, R
Becker, R
Becker, HW
Winter, M
Merz, K
Fischer, RA
Devi, A
机构
[1] Ruhr Univ Bochum, Lehrstuhl Anorgan Chem 2, D-44780 Bochum, Germany
[2] Forschungszentrum Julich, IFF Inst Festkorperforsch, D-52425 Julich, Germany
[3] Forschungszentrum Julich, CNI Ctr Nanoelect Syst Informat Technol, D-52425 Julich, Germany
[4] Ruhr Univ Bochum, Lehrstuhl Expt Phys 3, D-44780 Bochum, Germany
[5] Ruhr Univ Bochum, Lehrstuhl Anorgan Chem 1, D-44780 Bochum, Germany
关键词
HfO2; high-kappa dielectrics; metal-organic precursors; MOCVD; ZrO2;
D O I
10.1002/cvde.200506394
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Metal-organic precursors of Zr and Hf with excellent vaporization characteristics and low decomposition temperatures are reported. The new mixed alkoxide precursors [Zr(O'Bu)(2)(tbaoac)(2)] (1) and [Hf(O'Bu)(2)(tbaoac)(2)] (2) were synthesized by facile alcohol-exchange reactions between [M(O'Pr)(2)(L)(2)] and tert-butanol [M = Zr, Hf; L= tert-butylacetoacetate (tbaoac)]. The six-coordinated monomeric compounds are volatile, stable in solution, and less sensitive to air and moisture compared to parent alkoxides such as [Zr(O'Bu)(4)] and [Hf(O'Bu)(4)]. It was possible to grow ZrO2 and HfO2 at low deposition temperatures, and the films were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and Rutherford back scattering (RBS) analysis. [Zr(O'Bu)(2)(tbaoac)(2)], evaluated in a rnultiwafer planetary MOCVD reactor combined with a liquid delivery system, yielded ZrO2 films that show promise for gate oxide applications.
引用
收藏
页码:172 / 180
页数:9
相关论文
共 38 条
[1]   THIN-FILMS OF METAL-OXIDES ON SILICON BY CHEMICAL VAPOR-DEPOSITION WITH ORGANOMETALLIC COMPOUNDS .1. [J].
BALOG, M ;
SCHIEBER, M ;
MICHMAN, M ;
PATAI, S .
JOURNAL OF CRYSTAL GROWTH, 1972, 17 (DEC) :298-&
[2]   CHEMICAL VAPOR-DEPOSITION AND CHARACTERIZATION OF ZRO2 FILMS FROM ORGANOMETALLIC COMPOUNDS [J].
BALOG, M ;
SCHIEBER, M ;
MICHMAN, M ;
PATAI, S .
THIN SOLID FILMS, 1977, 47 (02) :109-120
[3]   Mononuclear precursor for MOCVD of HfO2 thin films [J].
Baunemann, A ;
Thomas, R ;
Becker, R ;
Winter, M ;
Fischer, RA ;
Ehrhart, P ;
Waser, R ;
Devi, A .
CHEMICAL COMMUNICATIONS, 2004, (14) :1610-1611
[4]   Zirconia coatings realized by microwave plasma-enhanced chemical vapor deposition [J].
Bertrand, G ;
Mevrel, R .
THIN SOLID FILMS, 1997, 292 (1-2) :241-246
[5]   Mononuclear mixed β-ketoester-alkoxide compound of titanium as a promising precursor for low-temperature MOCVD of TiO2 thin films [J].
Bhakta, R ;
Hipler, F ;
Devi, A ;
Regnery, S ;
Ehrhart, P ;
Waser, R .
CHEMICAL VAPOR DEPOSITION, 2003, 9 (06) :295-298
[6]   METALLO-ORGANIC COMPOUNDS CONTAINING METAL-NITROGEN BONDS .1. SOME DIALKYLAMINO-DERIVATIVES OF TITANIUM AND ZIRCONIUM [J].
BRADLEY, DC ;
THOMAS, IM .
JOURNAL OF THE CHEMICAL SOCIETY, 1960, (OCT) :3857-3861
[7]  
BRADLEY DC, 2001, ALKOXO ARYLOXO DERIV, P37
[9]   Deposition of thin BST films in a multi-wafer planetary reactor [J].
Ehrhart, P ;
Fitsilis, F ;
Regnery, S ;
Waser, R ;
Schienle, F ;
Schumacher, M ;
Dauelsberg, M ;
Strzyzewski, P ;
Juergensen, H .
INTEGRATED FERROELECTRICS, 2000, 30 (1-4) :183-192
[10]   β-diketonate derivatives of titanium alkoxides:: X-ray crystal structures and solution dynamics of the binuclear complexes [{Ti(OR)3(dik)}2] [J].
Errington, RJ ;
Ridland, J ;
Clegg, W ;
Coxall, RA ;
Sherwood, JM .
POLYHEDRON, 1998, 17 (5-6) :659-674