Kelvin probe and scanning tunneling microscope characterization of Langmuir-Blodgett sapphyrin films

被引:15
作者
Goletti, C [1 ]
Sgarlata, A
Motta, N
Chiaradia, P
Paolesse, R
Angelaccio, A
Drago, M
Di Natale, C
D'Amico, A
Cocco, M
Troitsky, VI
机构
[1] Univ Roma Tor Vergata, Dipartimento Fis, I-00133 Rome, Italy
[2] Univ Roma Tor Vergata, Ist Nazl Fis Mat, I-00133 Rome, Italy
[3] Univ Roma Tor Vergata, Dipartimento Sci & Tecnol Chim, I-00133 Rome, Italy
[4] Univ Roma Tor Vergata, Dipartimento Ingn Elettron, I-00133 Rome, Italy
[5] Technobiochip SCARL, Marciana Marina, LI, Italy
关键词
D O I
10.1063/1.124653
中图分类号
O59 [应用物理学];
学科分类号
摘要
The work function of solid layers of increasing thicknesses of E2M8- sapphyrin, deposited on a gold substrate by the Langmuir-Blodgett method, has been measured by the Kelvin-probe technique. The results show that the contact-potential-difference values depend upon the layer thickness, reaching saturation after a certain amount of deposited sapphyrin. Scanning tunneling microscope images taken at the same coverages show that corresponding with this threshold, sapphyrin forms a true continuous layer on gold, completely covering the substrate. Evolution of the layer towards its completion is accompanied by a continuous variation of the work-function value, consistent with an increasing dipole term due to the interaction of sapphyrin with the metal substrate. (C) 1999 American Institute of Physics. [S0003-6951(99)04235-7].
引用
收藏
页码:1237 / 1239
页数:3
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