Low-dose aberration corrected cryo-electron microscopy of organic specimens

被引：37

作者：

Evans, James E. ^{[1
,4
]}

Hetherington, Crispin ^{[2
]}

Kirkland, Angus ^{[2
]}

Chang, Lan-Yun ^{[2
]}

Stahlberg, Henning ^{[1
]}

Browning, Nigel ^{[3
,4
]}

机构：

[1] Univ Calif Davis, Davis, CA 95616 USA

[2] Univ Oxford, Dept Mat, Oxford OX1 3PH, England

[3] Univ Calif Davis, Dept Mat Sci & Chem Engn, Davis, CA 95616 USA

[4] Lawrence Livermore Natl Lab, Chem Mat & Life Sci Directorate, Div Mat Sci & Technol, Livermore, CA 94550 USA

来源：

ULTRAMICROSCOPY | 2008年 / 108卷 / 12期

基金：

英国工程与自然科学研究理事会;

关键词：

Aberration correction; Electron microscopy; TEM; Cryo-EM;

D O I：

10.1016/j.ultramic.2008.06.004

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Spherical aberration (C-s) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions C-s-correction can provide a significant improvement in resolution (to less than 0.16 nm) for direct imaging of organic samples. (C) 2008 Published by Elsevier B.V.

引用

页码：1636 / 1644

页数：9

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