A 6-b 1.3-Gsample/s A/D converter in 0.35-μm CMOS

被引:180
作者
Choi, M [1 ]
Abidi, AA [1 ]
机构
[1] Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA 90095 USA
关键词
A/D converter; CMOS analog integrated circuits; comparators; flash converter; offset averaging; read channel; resistor averaging network; spatial filter; track-and-hold;
D O I
10.1109/4.972135
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A 6-b Nyquist A/D converter (ADC) that converts at 1.3 GHz is reported. Using array averaging and a wideband track-and-hold, a 6-b flash ADC achieves better than 5.5 effective bits for input frequencies up to 630 MHz at 1 Gsample/s, and five effective bits for 650-MHz input at 1.3 Gsample/s. Peak INL and DNL are less than 0.35 LSB and 0.2 LSB, respectively. This ADC consumes about 500 mW from 3.3 V at 1 Gsample/s. The chip occupies 0.8-mm(2) active area, fabricated in 0.35-mum CMOS.
引用
收藏
页码:1847 / 1858
页数:12
相关论文
共 41 条
[31]  
Sushihara K., 2000, 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056), P428, DOI 10.1109/ISSCC.2000.839845
[32]  
Tamba Y., 1999, IEEE INT SOL STAT CI, P324
[33]   A CMOS 6-b, 400-MSample/s ADC with error correction [J].
Tsukamoto, S ;
Schofield, WG ;
Endo, T .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1998, 33 (12) :1939-1947
[34]   A 6-bit 1 GHz acquisition speed CMOS flash ADC with digital error correction [J].
Uyttenhove, K ;
Marques, A ;
Steyaert, M .
PROCEEDINGS OF THE IEEE 2000 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 2000, :249-252
[35]  
VANDEPLASSCHE R, 1994, INTEGRATED ANALOG TO
[36]  
WAKIMOTO T, 1988, ISSCC, P232
[37]   CHARGE INJECTION IN ANALOG MOS SWITCHES [J].
WEGMANN, G ;
VITTOZ, EA ;
RAHALI, F .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1987, 22 (06) :1091-1097
[38]  
WEI D, 2001, IEEE INT SOL STAT CI, P186
[39]   HIGH-SPEED CMOS CIRCUIT TECHNIQUE [J].
YUAN, J ;
SVENSSON, C .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1989, 24 (01) :62-70
[40]   New single-clock CMOS latches and flipflops with improved speed and power savings [J].
Yuan, JR ;
Svensson, C .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1997, 32 (01) :62-69