Elastically relaxed free-standing strained-silicon nanomembranes

被引:226
作者
Roberts, MM
Klein, LJ
Savage, DE
Slinker, KA
Friesen, M
Celler, G
Eriksson, MA [1 ]
Lagally, MG
机构
[1] Univ Wisconsin, Madison, WI 53711 USA
[2] Soitec USA, Peabody, MA 01960 USA
关键词
D O I
10.1038/nmat1606
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Strain plays a critical role in the properties of materials. In silicon and silicon - germanium, strain provides a mechanism for control of both carrier mobility and band offsets. In materials integration, strain is typically tuned through the use of dislocations and elemental composition. We demonstrate a versatile method to control strain by fabricating membranes in which the final strain state is controlled by elastic strain sharing, that is, without the formation of defects. We grow Si/SiGe layers on a substrate from which they can be released, forming nanomembranes. X-ray-diffraction measurements confirm a final strain predicted by elasticity theory. The effectiveness of elastic strain to alter electronic properties is demonstrated by low-temperature longitudinal Hall-effect measurements on a strained-silicon quantum well before and after release. Elastic strain sharing and film transfer offer an intriguing path towards complex, multiple-layer structures in which each layer's properties are controlled elastically, without the introduction of undesirable defects.
引用
收藏
页码:388 / 393
页数:6
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