Paramorphic growth: A new approach in mismatched heteroepitaxy to prepare fully relaxed materials

被引:7
作者
Damlencourt, JF [1 ]
Leclercq, JL [1 ]
Gendry, M [1 ]
Garrigues, M [1 ]
Aberkane, N [1 ]
Hollinger, G [1 ]
机构
[1] Ecole Cent Lyon, LEOM, CNRS, UMR 5512, F-69621 Ecully, France
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1999年 / 38卷 / 9AB期
关键词
mismatched heteroepitaxy; relaxed seed membrane; regrowth; molecular beam epitaxy; InGaAs; elastic stress relaxation;
D O I
10.1143/JJAP.38.L996
中图分类号
O59 [应用物理学];
学科分类号
摘要
We propose paramorphic growth as a new approach for growing thick, ideally relaxed, epitaxial layers on mismatched substrates. First, a thin seed layer, originally grown pseudomorphically strained on a mismatched substrate coated with a sacrificial layer, is separated by chemical etching from its original substrate and subsequently deposited on the final substrate after bring elastically relaxed. Consequently, thick layers, lattice matched to the cubic-relaxed seed layer, can be grown epitaxially without the introduction of any structural defects. The validity of this approach is demonstrated by growing fully relaxed In(0.65)Gi(0.35)As thick layers on 300 x 300 mu m(2) platforms deposited on an InP substrate, using molecular beam epitaxy.
引用
收藏
页码:L996 / L999
页数:4
相关论文
共 21 条
[1]   PHOTOLUMINESCENCE AND DOUBLE-CRYSTAL X-RAY STUDY OF INGAAS/INP - EFFECT OF MISMATCH STRAIN ON BAND-GAP [J].
BASSIGNANA, IC ;
MINER, CJ ;
PUETZ, N .
JOURNAL OF APPLIED PHYSICS, 1989, 65 (11) :4299-4305
[2]  
BEALAND R, 1995, ADV PHYS, V45, P87
[3]   OVERCOMING THE PSEUDOMORPHIC CRITICAL THICKNESS LIMIT USING COMPLIANT SUBSTRATES [J].
CHUA, CL ;
HSU, WY ;
LIN, CH ;
CHRISTENSON, G ;
LO, YH .
APPLIED PHYSICS LETTERS, 1994, 64 (26) :3640-3642
[4]  
DEBOECK J, 1991, JPN J APPL PHYS 2, V30, pL423, DOI 10.1143/JJAP.30.L423
[5]   EPITAXIAL LIFT-OFF AND ITS APPLICATIONS [J].
DEMEESTER, P ;
POLLENTIER, I ;
DEDOBBELAERE, P ;
BRYS, C ;
VANDAELE, P .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1993, 8 (06) :1124-1135
[6]   Dislocation-free InSb grown on GaAs compliant universal substrates [J].
Ejeckam, FE ;
Seaford, ML ;
Lo, YH ;
Hou, HQ ;
Hammons, BE .
APPLIED PHYSICS LETTERS, 1997, 71 (06) :776-778
[7]   BAND-GAP DETERMINATION BY PHOTOREFLECTANCE OF INGAAS AND INALAS LATTICE MATCHED TO INP [J].
GASKILL, DK ;
BOTTKA, N ;
AINA, L ;
MATTINGLY, M .
APPLIED PHYSICS LETTERS, 1990, 56 (13) :1269-1271
[8]   EFFECT OF SURFACE STEPS AND NONSTOICHIOMETRY ON CRITICAL THICKNESS OF STRAINED INGAAS LAYERS GROWN BY MOLECULAR-BEAM EPITAXY ON INALAS/INP HETEROSTRUCTURES [J].
GENDRY, M ;
DROUOT, V ;
HOLLINGER, G ;
MAHAJAN, S .
APPLIED PHYSICS LETTERS, 1995, 66 (01) :40-42
[9]  
Gendry M., 1995, Semiconductor Heteroepitaxy. Growth, Characterization and Device Applications, P572
[10]   INTERFACIAL CHARACTERISTICS OF ALGAAS AFTER IN-SITU ELECTRON-CYCLOTRON-RESONANCE PLASMA-ETCHING AND MOLECULAR-BEAM EPITAXIAL REGROWTH [J].
HONG, M ;
MANNAERTS, JP ;
GROBER, L ;
CHU, SNG ;
LUFTMAN, HS ;
CHOQUETTE, KD ;
FREUND, RS .
JOURNAL OF APPLIED PHYSICS, 1994, 75 (06) :3105-3111