On the origin of the positive charge on hydrogenated Si surfaces and its dependence on the surface morphology

被引:20
作者
Dittrich, T [1 ]
Schwartzkopff, M
Hartmann, E
Rappich, J
机构
[1] Tech Univ Munich, Phys Dept E16, D-85748 Garching, Germany
[2] Hahn Meitner Inst Kernforsch Berlin GmbH, Abt Photovoltaik, D-12489 Berlin, Germany
关键词
hydrogenated silicon surfaces; surface morphology; surface photovoltage; surface states;
D O I
10.1016/S0039-6028(99)00712-8
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Chemically and electrochemically hydrogenated Si surfaces are investigated by surface photovoltage technique, scanning tunneling microscopy, and Fourier transform infrared spectroscopy. The surface states are predominantly of the donor type which can act as fixed positive surface charge (Q(f)) as well as fast surface states depending on the surface morphology and the applied field voltage. The donor type surface states on hydrogenated Si surfaces can be related to water molecules adsorbed at surface imperfections. The lowest values of Q(f) and of the density of surface states in the minimum D-it(min) (10(10) cm(-2) and 10(10) eV(-1) cm(-2), respectively) are reached on macroscopically rough hydrogenated surfaces which are locally very smooth. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:154 / 162
页数:9
相关论文
共 48 条
[11]   Electronic properties of thin Au/nanoporous-Si/n-Si structures [J].
Dittrich, T ;
Kliefoth, K ;
Sieber, I ;
Rappich, J ;
Rauscher, S ;
Timoshenko, VY .
THIN SOLID FILMS, 1996, 276 (1-2) :183-186
[12]   Unusual stabilization of Si surfaces during roughening in fluoride solution [J].
Dittrich, T ;
Timoshenko, VY ;
Rappich, J .
APPLIED PHYSICS LETTERS, 1998, 72 (13) :1635-1637
[13]   ELECTRONIC-PROPERTIES OF THE HF-PASSIVATED SI(111) SURFACE DURING THE INITIAL OXIDATION IN AIR [J].
DITTRICH, T ;
ANGERMANN, H ;
FUSSEL, W ;
FLIETNER, H .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1993, 140 (02) :463-470
[14]  
FLIETNER H, 1991, INSULATING FILMS ON SEMICONDUCTORS 1991, P151
[15]   SPECTRUM AND NATURE OF SURFACE STATES [J].
FLIETNER, H .
SURFACE SCIENCE, 1974, 46 (01) :251-264
[16]   VOLTAGE DROP IN THE EXPERIMENTS OF SCANNING TUNNELING MICROSCOPY FOR SI [J].
FLORES, F ;
GARCIA, N .
PHYSICAL REVIEW B, 1984, 30 (04) :2289-2291
[17]  
GRAF D, 1989, J VAC SCI TECHNOL A, V7, P808, DOI 10.1116/1.575845
[18]   INVESTIGATION OF ENERGETIC SURFACE-STATE DISTRIBUTIONS AT REAL SURFACES OF SILICON AFTER TREATMENT WITH HF AND H2O USING LARGE-SIGNAL PHOTO-VOLTAGE PULSES [J].
HEILIG, K ;
FLIETNER, H ;
REINEKE, J .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1979, 12 (06) :927-940
[19]  
HEILIG K, 1984, SOLID STATE ELECTRON, V27, P394
[20]   IDEAL HYDROGEN TERMINATION OF THE SI-(111) SURFACE [J].
HIGASHI, GS ;
CHABAL, YJ ;
TRUCKS, GW ;
RAGHAVACHARI, K .
APPLIED PHYSICS LETTERS, 1990, 56 (07) :656-658