Characterisation of Pd Schottky barrier on n-type GaN

被引:52
作者
Ping, AT [1 ]
Schmitz, AC [1 ]
Khan, MA [1 ]
Adesida, I [1 ]
机构
[1] UNIV ILLINOIS,DEPT ELECT & COMP ENGN,URBANA,IL 61801
关键词
Schottky barriers; gallium nitride;
D O I
10.1049/el:19960029
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The electrical characteristics of Pd Schottky barrier to n-type GaN grown by MOCVD were investigated. The effective barrier height was found to be 0.94 and 1.07eV from I-V and C-V measurements, respectively. The ideality factor was similar to 1.04. The effective Richardson constant was determined to be similar to 3.24Acm(-2)K(-2) using the modified Norde plot. These values were also compared to Au Schottky contacts.
引用
收藏
页码:68 / 70
页数:3
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