Effect of ion position on single-event transient current

被引：24

作者：

Hirao, T ^{[1
]}

Nashiyama, I ^{[1
]}

Kamiya, T ^{[1
]}

Suda, T ^{[1
]}

Sakai, T ^{[1
]}

Hamano, T ^{[1
]}

机构：

[1] TOHOKU UNIV, DEPT NUCL ENGN, TOHOKU, JAPAN

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1997年 / 130卷 / 1-4期

关键词：

D O I：

10.1016/S0168-583X(97)00377-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Using focused high-energy microbeams of carbon-and oxygen-ions and a high speed, wide bandwidth measurement system, we found a strong dependence of the collected charge and the transient current waveform on the position of ion incidences. Single-event charge is collected by a diffusion mechanism even when the ion strikes a position about 3 similar to 4 mu m away from the lateral boundary of the p(+) n-junction area. (C) 1997 Elsevier Science B.V.

引用

收藏

页码：486 / 490

页数：5

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