Scaling behaviors of reset voltages and currents in unipolar resistance switching

被引：82

作者：

Lee, S. B. ^{[1
,2
]}

Chae, S. C. ^{[1
,2
]}

Chang, S. H. ^{[1
,2
]}

Lee, J. S.

Seo, S. ^{[3
]}

Kahng, B.

Noh, T. W. ^{[1
,2
]}

机构：

[1] Seoul Natl Univ, ReCOE, Seoul 151747, South Korea

[2] Seoul Natl Univ, FPRD, Dept Phys & Astron, Seoul 151747, South Korea

[3] Samsung Adv Inst Technol, Suwon 440600, South Korea

来源：

APPLIED PHYSICS LETTERS | 2008年 / 93卷 / 21期

关键词：

capacitors; electrical conductivity transitions; nickel compounds; random-access storage;

D O I：

10.1063/1.3036532

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The wide distributions of switching voltages in unipolar switching currently pose major obstacles for scientific advancement and practical applications. Using NiO capacitors, we investigated the distributions of the reset voltage and current. We found that they scaled with the resistance value R-o in the low resistance state and that the scaling exponents varied at R-o approximate to 30 Omega. We explain these intriguing scaling behaviors and their crossovers by analogy with percolation theory. We show that the connectivity of conducting filaments plays a crucial role in the reset process.

引用

页数：3

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