Determination of Schottky barrier profile at Pt/SrTiO3:Nb junction by x-ray photoemission

被引：28

作者：

Ohashi, Naoki ^{[1
]}

Yoshikawa, Hideki ^{[1
]}

Yamashita, Yoshiyuki ^{[1
]}

Ueda, Shigenori ^{[1
]}

Li, Jianyong ^{[1
]}

Okushi, Hideyo ^{[1
]}

Kobayashi, Keisuke ^{[1
]}

Haneda, Hajime ^{[1
]}

机构：

[1] Natl Inst Mat Sci, Tsukuba, Ibaraki 3050044, Japan

来源：

APPLIED PHYSICS LETTERS | 2012年 / 101卷 / 25期

关键词：

DOPED SRTIO3; FILMS;

D O I：

10.1063/1.4772628

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The platinum/[niobium-doped strontium titanate] junction (Pt/SrTiO3:Nb) was investigated by x-ray photoemission (XPE) spectroscopy. Aluminum K alpha and synchrotron radiation (6 keV) were used to obtain XPE spectra with different probing depths. The broadening and shift of the XPE peaks for SrTiO3:Nb, which resulted from the formation of a potential barrier at the interface, were quantitatively analyzed by fitting simulations. The barrier height was calculated to be 0.7-0.8 regardless of the Nb concentration. Furthermore, the XPE profile of the junction was reproduced when the permittivity of SrTiO3 was assumed to depend on the electric field. VC 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4772628]

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页数：5

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