Effects of Al contents on microstructures of Cr1-XAlXN and Zr1-XAlXN films synthesized by cathodic arc method

被引:65
作者
Hasegawa, H [1 ]
Kawate, M [1 ]
Suzuki, T [1 ]
机构
[1] Keio Univ, Ctr Mat Sci, Kohoku Ku, Yokohama, Kanagawa 2238522, Japan
基金
日本学术振兴会;
关键词
Cr1-XAlXN; Zr1-XAlXN; microstructure; microhardness;
D O I
10.1016/j.surfcoat.2004.08.208
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Cr1-xAlxN and Zr1-xAlxN (0 <= x <= 1.0) films were synthesized by the cathodic arc method using alloy and metal targets. The X-ray diffraction patterns showed that the Cr1-xAlxN changed from cubic structure at X=0.6 to hexagonal structure at X=0.7. The peaks of Zr1-xAlxN showed the NaCl structure at X=0.37 and changed to wurtzite structure at X=0.50. The lattice parameter of Cr1-xAlxN films changed from 0.416 nm (X=0) to 0.413 nm (X=1.0), and that of Zr1-xAlxN changed from 0.458 nm (X=0) to 0.444 nm (X=0.37). The maximum microhardness of Cr1-xAlxN and Zr1-xAlxN films was 27 GPa (X=0.6) and 29 GPa (X=0.37), respectively. Changes in microstructures-related transition from the cubic to hexagonal were studied, and corresponding hardness changes were discussed in Cr1-xAlxN and Zr1-xAlxN. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:2409 / 2413
页数:5
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