The influence of the ion flux density on the properties of molybdenum films deposited from the vapour phase under simultaneous argon ion irradiation

被引:10
作者
Ensinger, W
机构
[1] Universität Augsburg, Institut für Physik, 86159 Augsburg
关键词
molybdenum; ion bombardment; argon; deposition process;
D O I
10.1016/0040-6090(95)07018-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Molybdenum was deposited from the vapour phase onto fused quartz and alumina at room temperature under simultaneous irradiation with energetic argon ions with different ion flux densities. It was observed that increasing ion irradiation intensity lead to a sight increase in grain size, to a reduction in oxygen incorporation from the residual gas, and to argon ion implantation. As a result, a strong reduction in resistivity was observed. On iron substrates, electrochemical polarization measurements showed a reduction in microporosity.
引用
收藏
页码:54 / 57
页数:4
相关论文
共 16 条
[1]   SIMULATION OF DEPOSITION AND DENSIFICATION IN AN ION-BEAM ENVIRONMENT [J].
ANDREADIS, TD ;
ROSEN, M ;
HAFTEL, MI ;
SPRAGUE, JA .
SURFACE & COATINGS TECHNOLOGY, 1992, 51 (1-3) :328-332
[2]   ION-BEAM-INDUCED TEXTURE FORMATION IN VACUUM-CONDENSED THIN METAL-FILMS [J].
DOBREV, D .
THIN SOLID FILMS, 1982, 92 (1-2) :41-53
[3]   MICROPOROSITY AND ADHESION OF ION BOMBARDED THIN SILICON SURFACE-FILMS [J].
ENSINGER, W ;
BARTH, M ;
WOLF, GK .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1988, 32 (1-4) :104-110
[4]  
ENSINGER W, IN PRESS SURF COAT T
[5]   INTERNAL-STRESS IN THIN-FILMS PREPARED BY ION-BEAM AND VAPOR-DEPOSITION [J].
KURATANI, N ;
IMAI, O ;
EBE, A ;
NISHIYAMA, S ;
OGATA, K .
SURFACE & COATINGS TECHNOLOGY, 1994, 66 (1-3) :310-312
[6]  
MOVCHAN BA, 1969, PHYS METALS METALLOG, V28, P83
[7]   ION-BEAM-INDUCED EPITAXIAL VAPOR-PHASE GROWTH - A MOLECULAR-DYNAMICS STUDY [J].
MULLER, KH .
PHYSICAL REVIEW B, 1987, 35 (15) :7906-7913
[8]  
MULLER KH, 1986, J APPL PHYS, V59, P2803, DOI 10.1063/1.336960
[9]   OPTICAL AND ELECTRICAL-PROPERTIES OF THIN SILVER FILMS GROWN UNDER ION-BOMBARDMENT [J].
PARMIGIANI, F ;
KAY, E ;
HUANG, TC ;
PERRIN, J ;
JURICH, M ;
SWALEN, JD .
PHYSICAL REVIEW B, 1986, 33 (02) :879-888
[10]   CONTROL OF MICROSTRUCTURE AND PROPERTIES OF COPPER-FILMS USING ION-ASSISTED DEPOSITION [J].
ROY, RA ;
CUOMO, JJ ;
YEE, DS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (03) :1621-1626