Mg-Ga liquid metal ion source for implantation doping of GaN

被引:4
作者
Cheng, J [1 ]
Steckl, AJ [1 ]
机构
[1] Univ Cincinnati, Nanoelect Lab, Cincinnati, OH 45221 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2001年 / 19卷 / 06期
关键词
D O I
10.1116/1.1410095
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A magnesium liquid metal ion source was investigated for p-type doping of GaN. The metal is an alloy composed of 33.3% Mg and 66.7% Ga. The source type is a direct heating needle source with a spring-type reservoir, which is constructed using tungsten wire and a ceramic tube. The source has been tested and characterized in a NanoFab 150 focused ion beam (FIB) system. A typical source lifetime was 250 muA h. Mg+ ion implantation of GaN thin films has been performed at different energies between 30 and 100 keV for doses ranging from 5 X 10(13) to 1 X 10(15) cm(-2). After Mg+ FIB implantation, samples were annealed at 1100degreesC in N-2 ambient. Low temperature photoluminescence with a He-Cd laser of 325 nm exhibited the donor-acceptor recombination peak, which was enhanced by the activated magnesium ions. (C) 2001 American Vacuum Society.
引用
收藏
页码:2551 / 2554
页数:4
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