Scanning force imaging of atomic size defects on the CaF2 (111) surface

被引:75
作者
Reichling, M [1 ]
Barth, C [1 ]
机构
[1] Free Univ Berlin, Fachbereich Phys, D-14195 Berlin, Germany
关键词
D O I
10.1103/PhysRevLett.83.768
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Cleaved (111) surfaces on CaF2 were imaged with scanning force microscopy operated in the dynamic mode in ultrahigh vacuum. Imaging the pristine surface reveals an atomic scale contrast with the structure expected For the fluorine terminated surface. We always reproduced the perfect surface periodicity never observing stable defects. However, after exposing the surface to 280 L of oxygen while constantly scanning, we detected,stable atomically resolved defects that are assigned to OH- groups incorporated into the surface. We could identify a jump of one of the groups from one atomic cell to the next. The observed contrast at regular lattice sites as well as at defects is discussed and qualitatively explained.
引用
收藏
页码:768 / 771
页数:4
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