Influence of the growth parameters on self-assembled Ge islands on Si(100)

被引:25
作者
Capellini, G [1 ]
De Seta, M [1 ]
Evangelisti, F [1 ]
机构
[1] Univ Roma TRE, Dipartimento Fis E Amaldi, Ist Nazl Fis Mat, I-00146 Rome, Italy
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 2002年 / 89卷 / 1-3期
关键词
chemical vapor deposition; Ge/Si alloying; Ge/Si (100) islands;
D O I
10.1016/S0921-5107(01)00846-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effect of deposition temperature on the growth dynamic, the shape. the size and the composition of Chemical Vapor Deposition (CVD) grown Ge/Si(100) islands have been investigated in the range bemeen 500 and 850 degreesC. We found that the growth dynamic of the islands changes strongly between 500 and 600 degreesC, going from a kinetically limited growth regime to nearly equilibrium conditions. At higher temperatures the island growth is instead mainly affected by Ge/Si alloying. We found that the increase of the growth temperature above 600 degreesC results in an increased Si/Ge alloying, the mean Ge concentration in the islands changing from x=0.75 at 600 degreesC to 0.28 at 850 degreesC, The determined SiGe intermixing and the consequent reduction of the effective mismatch completely accounts for observed island enlargement in the same temperature range. (C) 2002 Published by Elsevier Science B.V.
引用
收藏
页码:184 / 187
页数:4
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