Defects caused by high-energy ion beams, as measured by scanning probe methods

被引：5

作者：

Biró, LP ^{[1
]}

Gyulai, J ^{[1
]}

Márk, GI ^{[1
]}

Daróczi, CS ^{[1
]}

机构：

[1] Hungarian Acad Sci, Res Inst Tech Phys & Mat Sci, H-1525 Budapest, Hungary

来源：

MICRON | 1999年 / 30卷 / 03期

基金：

匈牙利科学研究基金会;

关键词：

ion-beam damage; atomic force microscopy; scanning tunneling microscopy;

D O I：

10.1016/S0968-4328(99)00009-8

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Scanning probe methods reveal new effects in the study of solids irradiated with ''swift'' heavy ions, i.e. with ions of extremely high energy ( > 20 MeV/nucleon). A synergism of electronic and nuclear stopping mechanisms has been found; on irradiated highly oriented pyrolytic graphite, the formation of carbon nanotubes was observed. In the present paper, an example of modeling of scanning tunneling microscopy and some of the problems in understanding SPT images is also presented. (C) 1999 Elsevier Science Ltd. All rights reserved.

引用

页码：245 / 254

页数：10

共 22 条

[1]

BIO LP, 1999, NUCL INSTRUM METH B, V148, P1102

[2] SCANNING-TUNNELING-MICROSCOPE INVESTIGATION OF A 215-MEV NE-IRRADIATED GRAPHITE SURFACE [J].

BIRO, LP ;

GYULAI, J ;

HAVANCSAK, K .

PHYSICAL REVIEW B, 1995, 52 (03) :2047-2053

[3] Scanning tunneling microscope investigation of carbon nanotubes produced by catalytic decomposition of acetylene [J].

Biro, LP ;

Lazarescu, S ;

Lambin, P ;

Thiry, PA ;

Fonseca, A ;

Nagy, JB ;

Lucas, AA .

PHYSICAL REVIEW B, 1997, 56 (19) :12490-12498

[4] Atomic scale investigation of surface modification induced by 215 MeV Ne irradiation on graphite [J].

Biro, LP ;

Gyulai, J ;

Havancsak, K .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1996, 112 (1-4) :270-274

[5] Comparison of damage produced by 209 MeV Kr irradiation in muscovite mica, graphite and silicon [J].

Biro, LP ;

Gyulai, J ;

Havancsak, K .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 122 (03) :476-480

[6] Scanning probe microscopy investigation of nanometer structures produced by irradiation with 200 MeV ions [J].

Biro, LP ;

Gyulai, J ;

Havancsak, K .

VACUUM, 1998, 50 (3-4) :263-272

[7] In-depth characterization of damage produced by swift heavy ion irradiation using a tapping mode atomic force microscope [J].

Biro, LP ;

Gyulai, J ;

Havancsak, K .

MATERIALS SCIENCE APPLICATIONS OF ION BEAM TECHNIQUES, 1997, 248-2 :129-134

[8] In-depth damage distribution by scanning probe methods in targets irradiated with 200 MeV ions [J].

Biro, LP ;

Gyulai, J ;

Havancsak, K ;

Didyk, AY ;

Frey, L ;

Ryssel, H .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 127 :32-37

[9] Use of atomic-force microscopy and of a parallel irradiation geometry for in-depth characterization of damage produced by swift Kr ions in silicon [J].

Biro, LP ;

Gyulai, J ;

Havancsak, K ;

Didyk, AY ;

Bogen, S ;

Frey, L .

PHYSICAL REVIEW B, 1996, 54 (17) :11853-11856

[10] AFM and STM investigation of carbon nanotubes produced by high energy ion irradiation of graphite [J].

Biró, LP ;

Márk, GI ;

Gyulai, J ;

Havancsák, K ;

Lipp, S ;

Lehrer, C ;

Frey, L ;

Ryssel, H .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1999, 147 (1-4) :142-147

← 1 2 3 →