A novel implantless MOS thin-film transistor with simple processing, excellent performance and ambipolar operation capability

被引:14
作者
Lin, HC [1 ]
Lin, CY [1 ]
Yeh, KL [1 ]
Huang, RG [1 ]
Wang, MF [1 ]
Yu, CM [1 ]
Huang, TY [1 ]
机构
[1] Natl Nano Device Labs, Hsinchu 300, Taiwan
来源
INTERNATIONAL ELECTRON DEVICES MEETING 2000, TECHNICAL DIGEST | 2000年
关键词
D O I
10.1109/IEDM.2000.904452
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel thin film transistor (TFT) capable of ambipolar operation is demonstrated. The field induced source drain region supplies abundant channel carriers during on-state. On the other hand, the region reduces off-state leakage. The suggested device structure and fabrication is advantageous in making the overall process simple and suitable for low temperature manufacturing. The ambipolar mode with superior characteristic is demonstrated.
引用
收藏
页码:857 / 859
页数:3
相关论文
共 7 条
  • [1] DEVICE SENSITIVITY OF FIELD-PLATED POLYSILICON HIGH-VOLTAGE TFTS AND THEIR APPLICATION TO LOW-VOLTAGE OPERATION
    HUANG, TY
    WU, IW
    LEWIS, AG
    CHIANG, A
    BRUCE, RH
    [J]. IEEE ELECTRON DEVICE LETTERS, 1990, 11 (11) : 541 - 543
  • [2] Nishisaka M., 1998, P DEV RES C DRC, P74
  • [3] Analysis of short-channel Schottky source/drain metal-oxide-semiconductor field-effect transistor on silicon-on-insulator substrate and demonstration of sub-50-nm n-type devices with metal gate
    Saitoh, W
    Itoh, A
    Yamagami, S
    Asada, M
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (11): : 6226 - 6231
  • [4] Fabrication of 30 nm gate length electrically variable shallow-junction metal-oxide-semiconductor field-effect transistors using a calixarene resist
    Sakamoto, T
    Kawaura, H
    Baba, T
    Fujita, J
    Ochiai, Y
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (06): : 2806 - 2808
  • [5] SYNDER JP, 1995, APPL PHYS LETT, V67, P1420
  • [6] SILICON FIELD-EFFECT TRANSISTOR BASED ON QUANTUM TUNNELING
    TUCKER, JR
    WANG, CL
    CARNEY, PS
    [J]. APPLIED PHYSICS LETTERS, 1994, 65 (05) : 618 - 620
  • [7] Enhancement of hot-electron generation rate in Schottky source metal-oxide-semiconductor field-effect transistors
    Uchida, K
    Matsuzawa, K
    Koga, J
    Takagi, S
    Toriumi, A
    [J]. APPLIED PHYSICS LETTERS, 2000, 76 (26) : 3992 - 3994