Schottky rectifiers fabricated on free-standing GaN substrates

被引:36
作者
Johnson, JW
LaRoch, JR
Ren, F
Gila, BP
Overberg, ME
Abernathy, CR
Chyi, JI
Chou, CC
Nee, TE
Lee, CM
Lee, KP
Park, SS
Park, YJ
Pearton, SJ
机构
[1] Univ Florida, Dept Chem Engn, Gainesville, FL 32611 USA
[2] Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32611 USA
[3] Natl Cent Univ, Dept Elect Sci & Engn, Chungli 32054, Taiwan
[4] Samsung Adv Inst Technol, Suwon 440600, South Korea
关键词
D O I
10.1016/S0038-1101(01)00059-4
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
GaN Schottky rectifiers have been fabricated on free-standing substrates and on epi/substrate structures. Forward turn-on voltages were as low as 3 V at 25 degreesC. Reverse recovery was complete in <600 ns; with a characteristic time constant of <similar to>163 ns. The temperature coefficient For reverse breakdown voltage (V-B) was -2.5 +/- 0.6 V K-1 which is much lower than for lateral rectifiers reported previously, where values up to -30 VK-1 were achieved. Reverse currents increased with rectifying contact diameter and V-B decreased with increasing contact size, The best on-state resistance was 20.5 m Omega cm(-2) for diodes with V-B =450 V, producing a figure-of-merit (YB)(2)/R-ON of similar to 10 MW cm(-2). (C) 2001 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:405 / 410
页数:6
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