Controlled growth of silicon nanocrystallites in silicon oxide matrix using 150 MeV Ag ion irradiation

被引:20
作者
Chaudhari, PS
Bhave, TM
Pasricha, R
Singh, F
Kanjilal, D
Bhoraskar, SV [1 ]
机构
[1] Univ Poona, Dept Phys, Pune 411007, Maharashtra, India
[2] Natl Chem Lab, Pune 411008, Maharashtra, India
[3] Ctr Nucl Sci, New Delhi 110067, India
关键词
silicon nanocrystallites; oxide matrix; swift heavy ion irradiation;
D O I
10.1016/j.nimb.2005.04.069
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We report the synthesis of silicon nanocrystals grown in silicon oxide matrix by swift heavy ion irradiation. Thin films of silicon oxide (SiOx) are irradiated with 150 MeV silver ions at fluence varying from 5 x 10(11) to 1 x 10(13) ions/cm(2). The variation in the properties of silicon nanocrystals embedded in silicon oxide with varying fluence is studied. The energy of the photoluminescence peak corresponding to the silicon nanocrystals is found to be red shifted with increasing fluence. The trends in the broadening of the X-ray diffraction peak with decreasing fluence supports the controlled growth of silicon nanocrystals in silicon oxide matrix. The crystallite size of nanoclusters of silicon is seen to increase with increasing fluence. The results are discussed in view of the structural transformation, in SiOx matrix, caused by swift heavy ion irradiation. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:185 / 190
页数:6
相关论文
共 15 条
[1]   Surface work function studies in porous silicon [J].
Bhave, TM ;
Bhoraskar, SV .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (04) :2073-2078
[2]   Swift heavy ion induced growth of nanocrystalline silicon in silicon oxide [J].
Chaudhari, PS ;
Bhave, TM ;
Kanjilal, D ;
Bhoraskar, SV .
JOURNAL OF APPLIED PHYSICS, 2003, 93 (06) :3486-3489
[3]   Photoluminescence and I-V characteristics of a CdS-nanoparticles-porous-silicon heterojunction [J].
Deshmukh, NV ;
Bhave, TM ;
Ethiraj, AS ;
Sainkar, SR ;
Ganesan, V ;
Bhoraskar, SV ;
Kulkarni, SK .
NANOTECHNOLOGY, 2001, 12 (03) :290-294
[4]   Electron exo-emission study of PECVD and thermal CVD silicon rich silicon oxide [J].
Dusane, S ;
Bhave, T ;
Hullavard, S ;
Bhoraskar, SV ;
Lokhare, S .
SOLID STATE COMMUNICATIONS, 1999, 111 (08) :431-435
[5]   Visible luminescence from nanocrystalline silicon films produced by plasma enhanced chemical vapor deposition [J].
Edelberg, E ;
Bergh, S ;
Naone, R ;
Hall, M ;
Aydil, ES .
APPLIED PHYSICS LETTERS, 1996, 68 (10) :1415-1417
[6]  
Fernandez BG, 2002, J APPL PHYS, V91, P798, DOI 10.1063/1.1423768
[7]   Effect of passivation and aging on the photoluminescence of silicon nanocrystals [J].
Ledoux, G ;
Gong, J ;
Huisken, F .
APPLIED PHYSICS LETTERS, 2001, 79 (24) :4028-4030
[8]   Photoluminescence of silicon nanoclusters with reduced size dispersion produced by laser ablation [J].
Patrone, L ;
Nelson, D ;
Safarov, VI ;
Sentis, M ;
Marine, W ;
Giorgio, S .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (08) :3829-3837
[9]   Time of flight secondary ion mass spectrometry study of silicon nanoclusters embedded in thin silicon oxide layers [J].
Perego, M ;
Ferrari, S ;
Spiga, S ;
Bonera, E ;
Fanciulli, M ;
Soncini, V .
APPLIED PHYSICS LETTERS, 2003, 82 (01) :121-123
[10]   Evidence of light-emitting amorphous silicon clusters confined in a silicon oxide matrix [J].
Rinnert, H ;
Vergnat, M ;
Burneau, A .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (01) :237-243