A Nonvolatile Memory Device Made of a Ferroelectric Polymer Gate Nanodot and a Single-Walled Carbon Nanotube

被引:62
作者
Son, Jong Yeog [2 ]
Ryu, Sangwoo [2 ]
Park, Yoon-Cheol [2 ]
Lim, Yun-Tak [3 ]
Shin, Yun-Sok [2 ]
Shin, Young-Han [1 ]
Jang, Hyun Myung [2 ]
机构
[1] Univ Ulsan, Dept Phys, Ulsan 680749, South Korea
[2] Pohang Univ Sci & Technol POSTECH, Dept Mat Sci & Engn, Pohang 790784, South Korea
[3] Pohang Univ Sci & Technol POSTECH, Div Adv Mat Sci, Pohang 790784, South Korea
关键词
ferroelectric polymer nanodot; carbon nanotube; field-effect transistor; nonvolatile memory device; FIELD-EFFECT TRANSISTORS; NANOSTRUCTURES; COPOLYMERS; MECHANISM; ARRAYS;
D O I
10.1021/nn1021296
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We demonstrate a field-effect nonvolatile memory device made of a ferroelectric copolymer gate nanodot and a single-walled carbon nanotube (SW-CNT). A position-controlled dip-pen nanolithography was performed to deposit a poly(vinylidene fluoride-ran-trifluoroethylene) (PVDF-TrFE) nanodot onto the SW-CNT channel with both a source and drain for field-effect transistor (FET) function. PVDF-TrFE was chosen as a gate dielectric nanodot in order to efficiently exploit its bipolar chemical nature. A piezoelectric force microscopy study confirmed the canonical ferroelectric responses of the PVDF-TrFE nanodot fabricated at the center of the SWOT channel. The two distinct ferroelectric polarization states with the stable current retention and fatigue-resistant characteristics make the present PVDF-TrFE-based FET suitable for nonvolatile memory applications.
引用
收藏
页码:7315 / 7320
页数:6
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