Flotation measurements to reveal the reason for the discrepancy in the molar volume of silicon

被引:5
作者
Bettin, H [1 ]
Toth, H [1 ]
机构
[1] Phys Tech Bundesanstalt, D-3300 Braunschweig, Germany
关键词
avogadro constant; density; flotation; molar volume; silicon (single) crystals;
D O I
10.1109/TIM.2003.810721
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To reveal the reason for the discrepancy of relatively 3(.)10(-6) in the molar volume of silicon found in crystals of different origin, the densities of crystals grown under different conditions were compared using a flotation method. The method and the apparatus used at Physikalisch-Technische Bundesanstalt, Braunschweig, Germany, and the evaluation of data using Lagrange multipliers are described. The obtained results are reported and the contributions to the standard uncertainty of the silicon density rho(si) of about 1.0(.)10(-7) rho(si) are discussed.
引用
收藏
页码:636 / 640
页数:5
相关论文
共 9 条
[1]   Results of the project "silicon for mass unit and standard" (SIMUS) [J].
Alasia, F ;
Basile, G ;
D'Agostino, G ;
Peuto, A ;
Pettorruso, S ;
Becker, P ;
Bettin, H ;
Kuetgens, U ;
Stuempel, J ;
Valkiers, S ;
Taylor, P ;
De Biévre, P ;
Jensen, L ;
Servidori, M ;
Spirito, P ;
Zeni, L ;
Amato, G ;
Riemann, H ;
Haertwig, J ;
Von Ammon, W .
2002 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CONFERENCE DIGEST, 2002, :558-559
[2]   The influence of hydrogen and nitrogen on the floating zone growth of ultra-pure silicon crystals [J].
Becker, P ;
Bettin, H ;
Kuetgens, U ;
Basile, G ;
Riemann, H ;
Von Ammon, W ;
Goerigk, G .
2002 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CONFERENCE DIGEST, 2002, :564-565
[3]   The Avogadro problem:: Summary of tests on crystal imperfections [J].
Becker, P ;
Kuetgens, U ;
Stümpel, J .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2001, 50 (02) :612-615
[4]   DETERMINATION OF DIFFERENCES IN THE DENSITY OF SILICON SINGLE-CRYSTALS BY OBSERVING THEIR FLOTATION AT DIFFERENT PRESSURES [J].
KOZDON, AF ;
SPIEWECK, F .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1992, 41 (03) :420-426
[5]   About the existing discrepancy in the determinations of the Avogadro constant [J].
Martin, J ;
Bettin, H ;
Kuetgens, U ;
Schiel, D ;
Becker, P .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1999, 48 (02) :216-220
[6]  
Okaji M., 1992, Netsubussei, V6, P83
[7]  
SEYFRIED P, 1992, Z PHYS B CON MAT, V87, P289, DOI 10.1007/BF01309282
[8]  
SMIRNOW WI, 1973, LEHRGANG HOHEREN M 1, P419
[9]   DENSITY OF SILICON-CRYSTALS [J].
TANAKA, M ;
PEUTO, A .
METROLOGIA, 1994, 31 (03) :219-230